Delvin D. Eberlein

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Altoona, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit test socket
- Patent number 4,962,356
- Issue date Oct 9, 1990
- Cray Research, Inc.
- Delvin D. Eberlein
- G01 - MEASURING TESTING
Information Patent Grant
SPS CCD memory system with serial I/O registers
- Patent number 4,152,780
- Issue date May 1, 1979
- Sperry Rand Corporation
- Delvin D. Eberlein
- G11 - INFORMATION STORAGE