Denis Faucher

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Quebec City, CA

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Patents Grantslast 30 patents

Information Patent Grant
Probe holder providing constant lift-off for in-line bar-pipe testing
- Patent number 9,746,446
- Issue date Aug 29, 2017
- OLYMPUS SCIENTIFIC SOLUTIONS AMERICA INC.
- Denis Faucher
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current probe assembly adjustable for inspecting test objects...
- Patent number 8,264,221
- Issue date Sep 11, 2012
- Olympus NDT
- Denis Faucher
- G01 - MEASURING TESTING
Information Patent Grant
High resolution and flexible eddy current array probe
- Patent number 8,018,228
- Issue date Sep 13, 2011
- Olympus NDT
- Benoit Lepage
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HOLDER PROVIDING CONSTANT LIFT-OFF FOR IN-LINE BAR-PIPE TESTING
- Publication number 20170030867
- Publication date Feb 2, 2017
- Olympus Scientific Solutions Americas Inc.
- Denis Faucher
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER ADJUSTABLE TO CONFORM TO TEST SURFACES
- Publication number 20120006132
- Publication date Jan 12, 2012
- Denis Faucher
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT PROBE ASSEMBLY ADJUSTABLE FOR INSPECTING TEST OBJECTS...
- Publication number 20110025316
- Publication date Feb 3, 2011
- Denis Faucher
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION AND FLEXIBLE EDDY CURRENT ARRAY PROBE
- Publication number 20100007342
- Publication date Jan 14, 2010
- Benoit Lepage
- G01 - MEASURING TESTING