Denis Rideau

Person

Grenoble, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit comprising a single photon avalanche diode and c...
- Patent number 11,949,035
- Issue date Apr 2, 2024
- STMicroelectronics (Crolles 2) SAS
- Denis Rideau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single-photon avalanche photodiode
- Patent number 11,581,449
- Issue date Feb 14, 2023
- STMicroelectronics (Crolles 2) SAS
- Younes Benhammou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor
- Patent number 11,049,892
- Issue date Jun 29, 2021
- STMicroelectronics (Crolles 2) SAS
- Axel Crocherie
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image sensor
- Patent number 10,903,259
- Issue date Jan 26, 2021
- STMicroelectronics (Crolles 2) SAS
- Denis Rideau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming stressed semiconductor layer
- Patent number 9,543,214
- Issue date Jan 10, 2017
- STMicroelectronics S.A.
- Denis Rideau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabricating SOI transistors for an increased integratio...
- Patent number 9,514,996
- Issue date Dec 6, 2016
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Francois Andrieu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
PMOS transistor with improved mobility of the carriers
- Patent number 9,356,090
- Issue date May 31, 2016
- STMicroelectronics (Crolles 2) SAS
- Vincent Fiori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of locally stressing a semiconductor layer
- Patent number 9,331,175
- Issue date May 3, 2016
- STMicroelectronics S.A.
- Pierre Morin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of stressing a semiconductor layer
- Patent number 9,318,372
- Issue date Apr 19, 2016
- STMicroelectronics S.A.
- Olivier Nier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming stressed SOI layer
- Patent number 9,305,828
- Issue date Apr 5, 2016
- STMicroelectronics S.A.
- Denis Rideau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of introducing local stress in a semiconductor layer
- Patent number 9,240,466
- Issue date Jan 19, 2016
- STMicroelectronics S.A.
- Pierre Morin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide semiconductor (MOS) device with locally thickened gate...
- Patent number 8,928,051
- Issue date Jan 6, 2015
- International Business Machines Corporation
- Erwan Dornel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide semiconductor (MOS) device with locally thickened gate...
- Patent number 8,741,704
- Issue date Jun 3, 2014
- International Business Machines Corporation
- Erwan Dornel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT COMPRISING A SINGLE PHOTON AVALANCHE DIODE AND C...
- Publication number 20240194815
- Publication date Jun 13, 2024
- STMicroelectronics (Crolles 2) SAS
- Denis RIDEAU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-PHOTON AVALANCHE PHOTODIODE
- Publication number 20230178677
- Publication date Jun 8, 2023
- STMicroelectronics (Crolles 2) SAS
- Younes BENHAMMOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT COMPRISING A SINGLE PHOTON AVALANCHE DIODE AND C...
- Publication number 20220190184
- Publication date Jun 16, 2022
- STMicroelectronics (Crolles 2) SAS
- Denis RIDEAU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-PHOTON AVALANCHE PHOTODIODE
- Publication number 20200203547
- Publication date Jun 25, 2020
- STMicroelectronics (Crolles 2) SAS
- Younes BENHAMMOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR
- Publication number 20200013812
- Publication date Jan 9, 2020
- STMicroelectronics (Crolles 2) SAS
- Axel Crocherie
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE SENSOR
- Publication number 20200013820
- Publication date Jan 9, 2020
- STMicroelectronics (Crolles 2) SAS
- Denis Rideau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR FABRICATING SOI TRANSISTORS FOR AN INCREASED INTEGRATIO...
- Publication number 20160307809
- Publication date Oct 20, 2016
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Francois ANDRIEU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR RELAXING THE TRANSVERSE MECHANICAL STRESSES WITHIN THE A...
- Publication number 20160099183
- Publication date Apr 7, 2016
- STMicroelectronics (Crolles 2) SAS
- Denis Rideau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PMOS TRANSISTOR WITH IMPROVED MOBILITY OF THE CARRIERS
- Publication number 20150311277
- Publication date Oct 29, 2015
- STMicroelectronics (Crolles 2) SAS
- Vincent Fiori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING STRESSED SEMICONDUCTOR LAYER
- Publication number 20150118805
- Publication date Apr 30, 2015
- STMicroelectronics S.A.
- Denis Rideau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF STRESSING A SEMICONDUCTOR LAYER
- Publication number 20150118823
- Publication date Apr 30, 2015
- STMicroelectronics S.A.
- Olivier Nier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING STRESSED SOI LAYER
- Publication number 20150118824
- Publication date Apr 30, 2015
- STMicroelectronics S.A.
- Denis Rideau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR RELAXING THE TRANSVERSE MECHANICAL STRESSES WITHIN THE A...
- Publication number 20150097241
- Publication date Apr 9, 2015
- STMicroelectronics (Crolles 2) SAS
- Denis Rideau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF LOCALLY STRESSING A SEMICONDUCTOR LAYER
- Publication number 20150044827
- Publication date Feb 12, 2015
- STMicoelectronics S.A.
- Pierre Morin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INTRODUCING LOCAL STRESS IN A SEMICONDUCTOR LAYER
- Publication number 20150044826
- Publication date Feb 12, 2015
- STMicroelectronics S.A.
- Pierre Morin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL OXIDE SEMICONDUCTOR (MOS) DEVICE WITH LOCALLY THICKENED GATE...
- Publication number 20140070331
- Publication date Mar 13, 2014
- STMicroelectronics S.A.
- Erwan Dornel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL OXIDE SEMICONDUCTOR (MOS) DEVICE WITH LOCALLY THICKENED GATE...
- Publication number 20130234218
- Publication date Sep 12, 2013
- STMicroelectronics S.A.
- Erwan Dornel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method Making Same
- Publication number 20110303990
- Publication date Dec 15, 2011
- ST Microelectronics
- Erwan Dornel
- H01 - BASIC ELECTRIC ELEMENTS

Denis Rideau

Person

Patents Grantslast 30 patents

Integrated circuit comprising a single photon avalanche diode and c...

Single-photon avalanche photodiode

Image sensor

Image sensor

Method of forming stressed semiconductor layer

Process for fabricating SOI transistors for an increased integratio...

PMOS transistor with improved mobility of the carriers

Method of locally stressing a semiconductor layer

Method of stressing a semiconductor layer

Method of forming stressed SOI layer

Method of introducing local stress in a semiconductor layer

Metal oxide semiconductor (MOS) device with locally thickened gate...

Metal oxide semiconductor (MOS) device with locally thickened gate...

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT COMPRISING A SINGLE PHOTON AVALANCHE DIODE AND C...

SINGLE-PHOTON AVALANCHE PHOTODIODE

INTEGRATED CIRCUIT COMPRISING A SINGLE PHOTON AVALANCHE DIODE AND C...

SINGLE-PHOTON AVALANCHE PHOTODIODE

IMAGE SENSOR

IMAGE SENSOR

PROCESS FOR FABRICATING SOI TRANSISTORS FOR AN INCREASED INTEGRATIO...

METHOD FOR RELAXING THE TRANSVERSE MECHANICAL STRESSES WITHIN THE A...

PMOS TRANSISTOR WITH IMPROVED MOBILITY OF THE CARRIERS

METHOD OF FORMING STRESSED SEMICONDUCTOR LAYER

METHOD OF STRESSING A SEMICONDUCTOR LAYER

METHOD OF FORMING STRESSED SOI LAYER

METHOD FOR RELAXING THE TRANSVERSE MECHANICAL STRESSES WITHIN THE A...

METHOD OF LOCALLY STRESSING A SEMICONDUCTOR LAYER

METHOD OF INTRODUCING LOCAL STRESS IN A SEMICONDUCTOR LAYER

METAL OXIDE SEMICONDUCTOR (MOS) DEVICE WITH LOCALLY THICKENED GATE...

METAL OXIDE SEMICONDUCTOR (MOS) DEVICE WITH LOCALLY THICKENED GATE...

Semiconductor Device and Method Making Same