Denis SUHANOV

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Ashdod, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,568,531
- Issue date Jan 31, 2023
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning-based defect detection of a specimen
- Patent number 11,449,711
- Issue date Sep 20, 2022
- Applied Materials Isreal Ltd
- Ran Badanes
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN
- Publication number 20210209418
- Publication date Jul 8, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ran BADANES
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...
- Publication number 20200294224
- Publication date Sep 17, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING