Dennis M. Petrich

Person

Minnetonka, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for analyzing measurements
- Patent number 6,799,144
- Issue date Sep 28, 2004
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis of noise in repetitive waveforms
- Patent number 6,449,570
- Issue date Sep 10, 2002
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for jitter analysis
- Patent number 6,356,850
- Issue date Mar 12, 2002
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing measurements
- Patent number 6,298,315
- Issue date Oct 2, 2001
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis of noise in repetitive waveforms
- Patent number 6,185,509
- Issue date Feb 6, 2001
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Grant
Transmission line connector and contact set assembly for test site
- Patent number 4,574,235
- Issue date Mar 4, 1986
- Micro Component Technology, Inc.
- Thomas C. Kelly
- G01 - MEASURING TESTING
Information Patent Grant
AC parametric circuit having adjustable delay lock loop
- Patent number 4,527,126
- Issue date Jul 2, 1985
- Micro Component Technology, Inc.
- Dennis M. Petrich
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test apparatus test head
- Patent number 4,517,512
- Issue date May 14, 1985
- Micro Component Technology, Inc.
- Dennis M. Petrich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for analyzing measurements
- Publication number 20050027477
- Publication date Feb 3, 2005
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for jitter analysis
- Publication number 20020120420
- Publication date Aug 29, 2002
- Wavecrest Corporation
- Jan B. Wilstrup
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for analyzing measurements
- Publication number 20010044704
- Publication date Nov 22, 2001
- Wavecrest Corporation
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING

Dennis M. Petrich

Person

Patents Grantslast 30 patents

Method and apparatus for analyzing measurements

Analysis of noise in repetitive waveforms

Method and apparatus for jitter analysis

Method and apparatus for analyzing measurements

Analysis of noise in repetitive waveforms

Transmission line connector and contact set assembly for test site

AC parametric circuit having adjustable delay lock loop

Integrated circuit test apparatus test head

Patents Applicationslast 30 patents

Method and apparatus for analyzing measurements

Method and apparatus for jitter analysis

Method and apparatus for analyzing measurements