Deok-Hwa Hong

Person

Gwangmyeong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,146,734
- Issue date Nov 19, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for determining three-dimensional shape of object
- Patent number 12,135,204
- Issue date Nov 5, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focus-less inspection apparatus and method
- Patent number 12,105,029
- Issue date Oct 1, 2024
- Koh Young Technology Inc.
- Chan Kwon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Focus-less inspection apparatus and method
- Patent number 11,821,846
- Issue date Nov 21, 2023
- Koh Young Technology Inc.
- Chan Kwon Lee
- G01 - MEASURING TESTING
Information Patent Grant
OCT system, method of generating OCT image and storage medium
- Patent number 11,659,999
- Issue date May 30, 2023
- Koh Young Technology Inc.
- Young Joo Hong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for inspecting substrate and method thereof
- Patent number 11,543,238
- Issue date Jan 3, 2023
- Koh Young Technology Inc.
- Young Joo Hong
- G01 - MEASURING TESTING
Information Patent Grant
Optical tracking system and optical tracking method
- Patent number 11,436,750
- Issue date Sep 6, 2022
- Koh Young Technology Inc.
- Deok Hwa Hong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focus-less inspection apparatus and method
- Patent number 11,360,031
- Issue date Jun 14, 2022
- Koh Young Technology Inc.
- Chan Kwon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Optical tracking system and optical tracking method
- Patent number 11,033,337
- Issue date Jun 15, 2021
- Koh Young Technology Inc.
- Deok Hwa Hong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focus-less inspection apparatus and method
- Patent number 10,890,538
- Issue date Jan 12, 2021
- Koh Young Technology Inc.
- Chan Kwon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting substrate and method thereof
- Patent number 10,859,371
- Issue date Dec 8, 2020
- Koh Young Technology Inc.
- Young Joo Hong
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting film on substrate by using optical interfe...
- Patent number 10,852,125
- Issue date Dec 1, 2020
- Koh Young Technology Inc.
- Young Joo Hong
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting substrate and method thereof
- Patent number 10,823,548
- Issue date Nov 3, 2020
- Koh Young Technology Inc.
- Young Joo Hong
- G01 - MEASURING TESTING
Information Patent Grant
Item inspecting device
- Patent number 10,713,775
- Issue date Jul 14, 2020
- Koh Young Technology Inc.
- Young Heon Bae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical tracking system and optical tracking method
- Patent number 10,692,239
- Issue date Jun 23, 2020
- Koh Young Technology Inc.
- Deok Hwa Hong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring a height of 3-dimensional shape measurement app...
- Patent number 9,243,899
- Issue date Jan 26, 2016
- Koh Young Technology Inc.
- Joong Ki Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Joint inspection apparatus
- Patent number 9,091,668
- Issue date Jul 28, 2015
- Koh Young Technology Inc.
- Deok-Hwa Hong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20250012565
- Publication date Jan 9, 2025
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20240426766
- Publication date Dec 26, 2024
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20240060908
- Publication date Feb 22, 2024
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20220397390
- Publication date Dec 15, 2022
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20220364852
- Publication date Nov 17, 2022
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
- Publication number 20220357149
- Publication date Nov 10, 2022
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20220260503
- Publication date Aug 18, 2022
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20210102903
- Publication date Apr 8, 2021
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING SUBSTRATE AND METHOD THEREOF
- Publication number 20210018314
- Publication date Jan 21, 2021
- KOH YOUNG TECHNOLOGY INC.
- Young Joo Hong
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TRACKING SYSTEM AND OPTICAL TRACKING METHOD
- Publication number 20200279394
- Publication date Sep 3, 2020
- KOH YOUNG TECHNOLOGY INC.
- Deok Hwa HONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20200116653
- Publication date Apr 16, 2020
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
OCT SYSTEM, METHOD OF GENERATING OCT IMAGE AND STORAGE MEDIUM
- Publication number 20190350459
- Publication date Nov 21, 2019
- KOH YOUNG TECHNOLOGY INC.
- Young Joo HONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL TRACKING SYSTEM AND OPTICAL TRACKING METHOD
- Publication number 20190183583
- Publication date Jun 20, 2019
- KOH YOUNG TECHNOLOGY INC.
- Deok Hwa HONG
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL TRACKING SYSTEM AND OPTICAL TRACKING METHOD
- Publication number 20190188877
- Publication date Jun 20, 2019
- KOH YOUNG TECHNOLOGY INC.
- Deok Hwa HONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR INSPECTING SUBSTRATE AND METHOD THEREOF
- Publication number 20190162523
- Publication date May 30, 2019
- KOH YOUNG TECHNOLOGY INC.
- Young Joo Hong
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING SUBSTRATE AND METHOD THEREOF
- Publication number 20190162522
- Publication date May 30, 2019
- KOH YOUNG TECHNOLOGY INC.
- Young Joo Hong
- G01 - MEASURING TESTING
Information Patent Application
ITEM INSPECTING DEVICE
- Publication number 20190035066
- Publication date Jan 31, 2019
- KOH YOUNG TECHNOLOGY INC.
- Young Heon BAE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTING APPARATUS
- Publication number 20160216215
- Publication date Jul 28, 2016
- KOH YOUNG TECHNOLOGY INC.
- Deok-Hwa HONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING A HEIGHT OF 3-DIMENSIONAL SHAPE MEASUREMENT APP...
- Publication number 20150124081
- Publication date May 7, 2015
- KOH YOUNG TECHNOLOGY INC.
- Joong Ki Jeong
- G01 - MEASURING TESTING
Information Patent Application
JOINT INSPETION APPARATUS
- Publication number 20130259359
- Publication date Oct 3, 2013
- KOH YOUNG TECHNOLOGY INC.
- Deok-Hwa HONG
- G01 - MEASURING TESTING
Information Patent Application
Imaging system for shape measurement of partially-specular object a...
- Publication number 20080279458
- Publication date Nov 13, 2008
- Korea Advanced Institute of Science and Technology
- Deok-Hwa Hong
- G06 - COMPUTING CALCULATING COUNTING

Deok-Hwa Hong

Person

Patents Grantslast 30 patents

Apparatus and method for determining three-dimensional shape of object

Apparatus and method for determining three-dimensional shape of object

Focus-less inspection apparatus and method

Focus-less inspection apparatus and method

OCT system, method of generating OCT image and storage medium

Apparatus for inspecting substrate and method thereof

Optical tracking system and optical tracking method

Focus-less inspection apparatus and method

Optical tracking system and optical tracking method

Focus-less inspection apparatus and method

Apparatus for inspecting substrate and method thereof

Apparatus for inspecting film on substrate by using optical interfe...

Apparatus for inspecting substrate and method thereof

Item inspecting device

Optical tracking system and optical tracking method

Method of measuring a height of 3-dimensional shape measurement app...

Joint inspection apparatus

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

FOCUS-LESS INSPECTION APPARATUS AND METHOD

FOCUS-LESS INSPECTION APPARATUS AND METHOD

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT

FOCUS-LESS INSPECTION APPARATUS AND METHOD

FOCUS-LESS INSPECTION APPARATUS AND METHOD

APPARATUS FOR INSPECTING SUBSTRATE AND METHOD THEREOF

OPTICAL TRACKING SYSTEM AND OPTICAL TRACKING METHOD

FOCUS-LESS INSPECTION APPARATUS AND METHOD

OCT SYSTEM, METHOD OF GENERATING OCT IMAGE AND STORAGE MEDIUM

OPTICAL TRACKING SYSTEM AND OPTICAL TRACKING METHOD

OPTICAL TRACKING SYSTEM AND OPTICAL TRACKING METHOD

APPARATUS FOR INSPECTING SUBSTRATE AND METHOD THEREOF

APPARATUS FOR INSPECTING SUBSTRATE AND METHOD THEREOF

ITEM INSPECTING DEVICE

SUBSTRATE INSPECTING APPARATUS

METHOD OF MEASURING A HEIGHT OF 3-DIMENSIONAL SHAPE MEASUREMENT APP...

JOINT INSPETION APPARATUS

Imaging system for shape measurement of partially-specular object a...