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Der-Shen Wan
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Tucson, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Variable-wavelength illumination system for interferometry
Patent number
7,654,685
Issue date
Feb 2, 2010
Veeco Instruments, Inc.
Der-Shen Wan
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for white light interferometry and characteriza...
Patent number
7,649,634
Issue date
Jan 19, 2010
Mountain View Optical Consultant Corp.
Der-Shen Wan
G01 - MEASURING TESTING
Information
Patent Grant
Measurement of thin films using fourier amplitude
Patent number
7,612,891
Issue date
Nov 3, 2009
Veeco Instruments, Inc.
Der-Shen Wan
G01 - MEASURING TESTING
Information
Patent Grant
Microscope with fixed-element autocollimator for tilt adjustment
Patent number
7,016,050
Issue date
Mar 21, 2006
Veeco Instruments Inc.
Colin T. Farrell
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND SYSTEMS FOR WHITE LIGHT INTERFEROMETRY AND CHARACTERIZA...
Publication number
20090109444
Publication date
Apr 30, 2009
Der-Shen Wan
G01 - MEASURING TESTING
Information
Patent Application
Variable-wavelength illumination system for interferometry
Publication number
20080218999
Publication date
Sep 11, 2008
VEECO INSTRUMENTS, INC.
Der-Shen Wan
G01 - MEASURING TESTING
Information
Patent Application
Measurement of thin films using fourier amplitude
Publication number
20070139656
Publication date
Jun 21, 2007
Veeco Instruments Inc.
Der-Shen Wan
G01 - MEASURING TESTING
Information
Patent Application
Microscope with fixed-element autocollimator for tilt adjustment
Publication number
20040218191
Publication date
Nov 4, 2004
Colin T. Farrell
G02 - OPTICS