Derek Feltham

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Input/output delay testing for devices utilizing on-chip delay gene...
- Patent number 9,110,134
- Issue date Aug 18, 2015
- Intel Corporation
- Tak M. Mak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for disabling and swapping cores in a multi-co...
- Patent number 7,533,316
- Issue date May 12, 2009
- Intel Corporation
- Ray Ramadorai
- G01 - MEASURING TESTING
Information Patent Grant
Control register bus access through a standardized test access port
- Patent number 6,055,656
- Issue date Apr 25, 2000
- Intel Corporation
- James A. Wilson
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INPUT/OUTPUT DELAY TESTING FOR DEVICES UTILIZING ON-CHIP DELAY GENE...
- Publication number 20140189457
- Publication date Jul 3, 2014
- Tak M. Mak
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for disabling and swapping cores in a multi-co...
- Publication number 20070255985
- Publication date Nov 1, 2007
- Ray Ramadorai
- G01 - MEASURING TESTING