Derek G. Aqui

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Self aligning vacuum seal assembly
- Patent number 5,773,841
- Issue date Jun 30, 1998
- High Yield Technology, Inc.
- Derek Aqui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method to detect non-spherical particles using orthogonally polariz...
- Patent number 5,637,881
- Issue date Jun 10, 1997
- High Yield Technology, Inc.
- Raymond Burghard
- G01 - MEASURING TESTING
Information Patent Grant
Quasi bright field particle sensor
- Patent number 5,606,418
- Issue date Feb 25, 1997
- High Yield Technology, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Particle monitor for throttled pumping systems
- Patent number 5,534,706
- Issue date Jul 9, 1996
- High Yield Technology, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Modular particle monitor for vacuum process equipment
- Patent number 5,436,465
- Issue date Jul 25, 1995
- High Yield Technology, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
In situ real time particle monitor for a sputter coater chamber
- Patent number 5,347,138
- Issue date Sep 13, 1994
- High Yield Technology
- Derek G. Aqui
- G01 - MEASURING TESTING