Derek Rasugu

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Shakopee, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 12,140,571
- Issue date Nov 12, 2024
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 11,237,087
- Issue date Feb 1, 2022
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 10,663,380
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 9,472,374
- Issue date Oct 18, 2016
- Hysitron, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20220357251
- Publication date Nov 10, 2022
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20200408655
- Publication date Dec 31, 2020
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20170030812
- Publication date Feb 2, 2017
- HYSITRON, INC.
- Edward Cyrankowski
- G02 - OPTICS
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20140231670
- Publication date Aug 21, 2014
- HYSITRON, INC.
- Edward Cyrankowski
- G02 - OPTICS