Derek S. Bale

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Gibsonia, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
CdZnTe device using constrained design for high-flux x-ray spectros...
- Patent number 7,705,319
- Issue date Apr 27, 2010
- Endicott Interconnect Technologies, Inc.
- Derek S. Bale
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Infra-red light stimulated high-flux semiconductor x-ray and gamma-...
- Publication number 20100078559
- Publication date Apr 1, 2010
- Csaba Szeles
- G01 - MEASURING TESTING
Information Patent Application
CdZnTe Device Using Constrained Design For High-Flux X-Ray Spectros...
- Publication number 20090065701
- Publication date Mar 12, 2009
- II-VI Incorporated
- Derek S. Bale
- G01 - MEASURING TESTING