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Deron A. Walters
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Goleta, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Metrological scanning probe microscope
Patent number
RE49997
Issue date
Jun 4, 2024
Oxford Instruments Asylum Research, Inc.
Aleksander Labuda
Information
Patent Grant
Metrological scanning probe microscope
Patent number
10,705,114
Issue date
Jul 7, 2020
Oxford Instruments Asylum Research Inc
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Grant
Metrological scanning probe microscope
Patent number
10,338,096
Issue date
Jul 2, 2019
Oxford Instruments Asylum Research Inc
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Grant
Optical beam positioning unit for atomic force microscope
Patent number
10,054,612
Issue date
Aug 21, 2018
Oxford Instruments Asylum Research Inc
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Grant
Metrological scanning probe microscope
Patent number
9,804,193
Issue date
Oct 31, 2017
Oxford Instruments Asylum Research, Inc.
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Grant
Optical beam positioning unit for atomic force microscope
Patent number
9,383,386
Issue date
Jul 5, 2016
Oxford Instruments Asylum Research, Inc.
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Grant
Combined scanning probe and scanning energy microscope
Patent number
5,581,082
Issue date
Dec 3, 1996
The Regents of the University of California
Paul K. Hansma
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
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Patent Application
Metrological Scanning Probe Microscope
Publication number
20190324054
Publication date
Oct 24, 2019
Oxford Instruments Asylum Research, Inc.
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE
Publication number
20190064211
Publication date
Feb 28, 2019
Oxford Instruments Asylum Research, Inc.
David A. Grigg
G01 - MEASURING TESTING
Information
Patent Application
Metrological Scanning Probe Microscope
Publication number
20180128853
Publication date
May 10, 2018
Oxford Instruments Asylum Research, Inc.
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Application
Modular Atomic Force Microscope
Publication number
20170254834
Publication date
Sep 7, 2017
OXFORD INSTRUMENTS PLC
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Application
Optical Beam Positioning Unit for Atomic Force Microscope
Publication number
20160313368
Publication date
Oct 27, 2016
Oxford Instruments Asylum Research, Inc.
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Application
Metrological Scanning Probe Microscope
Publication number
20160169937
Publication date
Jun 16, 2016
Oxford Instruments Asylum Research, Inc.
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL BEAM POSITIONING UNIT FOR ATOMIC FORCE MICROSCOPE
Publication number
20140317790
Publication date
Oct 23, 2014
Aleksander Labuda
G01 - MEASURING TESTING
Information
Patent Application
Modular Atomic Force Microscope
Publication number
20140223612
Publication date
Aug 7, 2014
ASYLUM CORPORATION
Roger Proksch
B82 - NANO-TECHNOLOGY