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Desmond Allen Kaplan
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Tewksbury, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Triple quadrupole mass spectrometry coupled to trapped ion mobility...
Patent number
9,741,552
Issue date
Aug 22, 2017
Melvin Andrew Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Contamination-proof ion guide for mass spectrometry
Patent number
9,312,113
Issue date
Apr 12, 2016
Felician Muntean
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Selective ion mobility spectrometer formed from two consecutive mas...
Patent number
9,281,170
Issue date
Mar 8, 2016
Melvin Andrew Park
G01 - MEASURING TESTING
Information
Patent Grant
Selective ion mobility filter
Patent number
8,941,055
Issue date
Jan 27, 2015
Bruker Daltonik GmbH
Melvin Andrew Park
G01 - MEASURING TESTING
Information
Patent Grant
Selective ion mobility spectrometer formed from two consecutive mas...
Patent number
8,941,054
Issue date
Jan 27, 2015
Bruker Daltonik GmbH
Melvin Andrew Park
G01 - MEASURING TESTING
Information
Patent Grant
Spectrum acquisition modes for ion mobility spectrometers using tra...
Patent number
8,766,176
Issue date
Jul 1, 2014
Bruker Daltonics, Inc.
Melvin Andrew Park
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for gas-phase ion fragmentation
Patent number
8,575,542
Issue date
Nov 5, 2013
Bruker Daltonics, Inc.
Melvin Andrew Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Means and method for field asymmetric ion mobility spectrometry com...
Patent number
8,399,830
Issue date
Mar 19, 2013
Bruker Daltonics, Inc.
Melvin Andrew Park
G01 - MEASURING TESTING
Information
Patent Grant
Isolation of ions in overloaded RF ion traps
Patent number
8,324,566
Issue date
Dec 4, 2012
Bruker Daltonik GmbH
Desmond Allen Kaplan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Confining positive and negative ions in a linear RF ion trap
Patent number
8,227,748
Issue date
Jul 24, 2012
Bruker Daltonik GmbH
Christian Berg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Octapole ion trap mass spectrometers and related methods
Patent number
7,514,674
Issue date
Apr 7, 2009
The University of North Carolina at Chapel Hill
Gary L. Glish
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
TRIPLE QUADRUPOLE MASS SPECTROMETRY COUPLED TO TRAPPED ION MOBILITY...
Publication number
20170178887
Publication date
Jun 22, 2017
Bruker Daltonics, Inc.
Melvin Andrew Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SELECTIVE ION MOBILITY SPECTROMETER FORMED FROM TWO CONSECUTIVE MAS...
Publication number
20150069228
Publication date
Mar 12, 2015
Bruker Daltonik GmbH
Melvin Andrew PARK
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR GAS-PHASE ION FRAGMENTATION
Publication number
20130277570
Publication date
Oct 24, 2013
Bruker Daltonics, Inc.
Melvin Andrew PARK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEANS AND METHOD FOR FIELD ASYMMETRIC ION MOBILITY SPECTROMETRY COM...
Publication number
20120298860
Publication date
Nov 29, 2012
Bruker Daltonics, Inc.
Melvin Andrew PARK
G01 - MEASURING TESTING
Information
Patent Application
SELECTIVE ION MOBILITY SPECTROMETER
Publication number
20120286156
Publication date
Nov 15, 2012
Bruker Daltonik GmbH
Melvin Andrew Park
G01 - MEASURING TESTING
Information
Patent Application
Spectrum Acquisition Modes For Ion Mobility Spectrometers Using Tra...
Publication number
20120273670
Publication date
Nov 1, 2012
Bruker Daltonik GmbH
Melvin Andrew Park
G01 - MEASURING TESTING
Information
Patent Application
Selective Ion Mobility Spectrometer
Publication number
20120273673
Publication date
Nov 1, 2012
Bruker Daltonik GmbH
Melvin Andrew Park
G01 - MEASURING TESTING
Information
Patent Application
ISOLATION OF IONS IN OVERLOADED RF ION TRAPS
Publication number
20120223222
Publication date
Sep 6, 2012
Bruker Daltonik GmbH
Desmond Allen Kaplan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONFINING POSITIVE AND NEGATIVE IONS IN A LINEAR RF ION TRAP
Publication number
20110284738
Publication date
Nov 24, 2011
Bruker Daltonik GmbH
Christian Berg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Octapole Ion Trap Mass Spectrometers And Related Methods
Publication number
20080111067
Publication date
May 15, 2008
Gary L. Glish
H01 - BASIC ELECTRIC ELEMENTS