Detlef BAHR

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Karlsruhe, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method of adjusting the primary side of an X-ray diffractometer
- Patent number 10,598,615
- Issue date Mar 24, 2020
- Andreas Kleine
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray optical system and method for imaging a source
- Patent number 6,925,147
- Issue date Aug 2, 2005
- Bruker Axs GmbH
- Joachim Lange
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optical system with collimator in the focus of an X-ray mirror
- Patent number 6,898,270
- Issue date May 24, 2005
- Bruker Axs GmbH
- Joachim Lange
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray diffractometer
- Patent number 6,665,372
- Issue date Dec 16, 2003
- Bruker Axs GmbH
- Detlef Bahr
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ADJUSTING THE PRIMARY SIDE OF AN X-RAY DIFFRACTOMETER
- Publication number 20170160212
- Publication date Jun 8, 2017
- INCOATEC GmbH
- Andreas KLEINE
- G01 - MEASURING TESTING
Information Patent Application
X-ray optical system with collimator in the focus of an X-ray mirror
- Publication number 20030112923
- Publication date Jun 19, 2003
- Bruker AXS GmbH
- Joachim Lange
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray optical system and method for imaging a source
- Publication number 20030108153
- Publication date Jun 12, 2003
- Bruker AXS GmbH
- Joachim Lange
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray diffractometer
- Publication number 20030043965
- Publication date Mar 6, 2003
- Bruker AXS GmbH
- Detlef Bahr
- G01 - MEASURING TESTING