Detlef Knebel

Person

Berlin, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring device for a scanning probe microscope and method for sca...
- Patent number 11,156,632
- Issue date Oct 26, 2021
- Bruker Nano GmbH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for a scanning probe microscope, scanning probe mi...
- Patent number 10,539,591
- Issue date Jan 21, 2020
- Bruker Nano GmbH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the combined analysis of a sample with obj...
- Patent number 8,898,809
- Issue date Nov 25, 2014
- JPK Instruments AG
- Torsten Müller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device for receiving a test sample
- Patent number 8,506,909
- Issue date Aug 13, 2013
- JPK Instruments AG
- Olaf Sünwoldt
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measuring probe device for a probe microscope, measuring cell and s...
- Patent number 8,505,109
- Issue date Aug 6, 2013
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for characterizing a sample with two or more o...
- Patent number 8,415,613
- Issue date Apr 9, 2013
- JPK Instruments AG
- Sven-Peter Heyn
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for providing a probe for a probe-microscopic analysis of a...
- Patent number 7,971,266
- Issue date Jun 28, 2011
- JPK Instruments AG
- Torsten Jähnke
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and a device for the positioning of a displaceable component...
- Patent number 7,934,323
- Issue date May 3, 2011
- JPK Instruments AG
- Detlef Knebel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,473,894
- Issue date Jan 6, 2009
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Method for locally highly resolved, mass-spectroscopic characteriza...
- Patent number 7,442,922
- Issue date Oct 28, 2008
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to study a surfactant
- Patent number 7,155,962
- Issue date Jan 2, 2007
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,022,985
- Issue date Apr 4, 2006
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measuring Device for a Scanning Probe Microscope and Method for Sca...
- Publication number 20200400715
- Publication date Dec 24, 2020
- BRUKER NANO GMBH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...
- Publication number 20190170789
- Publication date Jun 6, 2019
- BRUKER NANO GMBH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Examining a Sample with a Probe Microscope
- Publication number 20110302676
- Publication date Dec 8, 2011
- JPK INSTRUMENTS AG
- Jacob Kerssemakers
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJ...
- Publication number 20100263098
- Publication date Oct 14, 2010
- Torsten Müller
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE DEVICE FOR A PROBE MICROSCOPE, MEASURING CELL AND S...
- Publication number 20100263096
- Publication date Oct 14, 2010
- Torsten Jähnke
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method and Apparatus for Characterizing a Sample with Two or More O...
- Publication number 20100251437
- Publication date Sep 30, 2010
- JPK INSTRUMENTS AG
- Sven-Peter Heyn
- G02 - OPTICS
Information Patent Application
Method for providing a probe for a probe-microscopic analysis of a...
- Publication number 20090300807
- Publication date Dec 3, 2009
- Torsten Jähnke
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Positioning a Movable Part in a Test System
- Publication number 20090140685
- Publication date Jun 4, 2009
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Device for Receiving a Test Sample
- Publication number 20080163702
- Publication date Jul 10, 2008
- Olaf Sunwoldt
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for a scanning probe microscope
- Publication number 20060168703
- Publication date Jul 27, 2006
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Method for locally highly resolved, mass-spectroscopic characterisa...
- Publication number 20060097164
- Publication date May 11, 2006
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for a scanning probe microscope
- Publication number 20050061970
- Publication date Mar 24, 2005
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Method and device for examining a surface-active substance
- Publication number 20040168506
- Publication date Sep 2, 2004
- Detlef Knebel
- G01 - MEASURING TESTING

Detlef Knebel

Person

Patents Grantslast 30 patents

Measuring device for a scanning probe microscope and method for sca...

Measuring device for a scanning probe microscope, scanning probe mi...

Method and apparatus for the combined analysis of a sample with obj...

Device for receiving a test sample

Measuring probe device for a probe microscope, measuring cell and s...

Method and apparatus for characterizing a sample with two or more o...

Method for providing a probe for a probe-microscopic analysis of a...

Method and a device for the positioning of a displaceable component...

Apparatus and method for a scanning probe microscope

Method for locally highly resolved, mass-spectroscopic characteriza...

Method and apparatus to study a surfactant

Apparatus and method for a scanning probe microscope

Patents Applicationslast 30 patents

Measuring Device for a Scanning Probe Microscope and Method for Sca...

Measuring Device for a Scanning Probe Microscope, Scanning Probe Mi...

Method and Device for Examining a Sample with a Probe Microscope

METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJ...

MEASURING PROBE DEVICE FOR A PROBE MICROSCOPE, MEASURING CELL AND S...

Method and Apparatus for Characterizing a Sample with Two or More O...

Method for providing a probe for a probe-microscopic analysis of a...

Method and Device for Positioning a Movable Part in a Test System

Device for Receiving a Test Sample

Apparatus and method for a scanning probe microscope

Method for locally highly resolved, mass-spectroscopic characterisa...

Apparatus and method for a scanning probe microscope

Method and device for examining a surface-active substance