Detlef Wolter

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Jenapriessnitz, DE

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Patents Grantslast 30 patents

Information Patent Grant
Measurement system with an optical measurement arrangement
- Patent number 7,277,190
- Issue date Oct 2, 2007
- Vistec Semiconductor Systems Jena GmbH
- Matthias Slodowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring the light emitted from an illum...
- Patent number 6,456,373
- Issue date Sep 24, 2002
- Leica Microsystems Jena GmbH
- Joachim Wienecke
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for inspecting a wafer
- Publication number 20070076943
- Publication date Apr 5, 2007
- Vistec Semiconductor Systems Jena GmbH
- Joachim Wienecke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical measurement arrangement
- Publication number 20040169868
- Publication date Sep 2, 2004
- LEICA MICROSYSTEMS JENA GmbH
- Matthias Slodowski
- G01 - MEASURING TESTING