Devis Contarato

Person

San Cartos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multiple column per channel CCD sensor architecture for inspection...
- Patent number 10,778,925
- Issue date Sep 15, 2020
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual-column-parallel CCD sensor and inspection systems using a sensor
- Patent number 10,764,527
- Issue date Sep 1, 2020
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and methods of inspecting and reviewin...
- Patent number 10,466,212
- Issue date Nov 5, 2019
- KLA-Tencor Corporation
- David L. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dark-field inspection using a low-noise sensor
- Patent number 10,462,391
- Issue date Oct 29, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dual-column-parallel CCD sensor and inspection systems using a sensor
- Patent number 10,313,622
- Issue date Jun 4, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and methods of inspecting and reviewin...
- Patent number 9,767,986
- Issue date Sep 19, 2017
- KLA-Tencor Corporation
- David L. Brown
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE SENSORS WITH A TUNABLE FLOATING DIFFUSION STRUCTURE
- Publication number 20240250110
- Publication date Jul 25, 2024
- KLA Corporation
- Abbas Haddadi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple Column Per Channel CCD Sensor Architecture For Inspection...
- Publication number 20190313044
- Publication date Oct 10, 2019
- Yung-Ho Alex Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dual-Column-Parallel CCD Sensor And Inspection Systems Using A Sensor
- Publication number 20190253652
- Publication date Aug 15, 2019
- Yung-Ho Alex Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning Electron Microscope And Methods Of Inspecting And Reviewin...
- Publication number 20170329025
- Publication date Nov 16, 2017
- KLA-Tencor Corporation
- David L. Brown
- G01 - MEASURING TESTING
Information Patent Application
Dual-Column-Parallel CCD Sensor And Inspection Systems Using A Sensor
- Publication number 20170295334
- Publication date Oct 12, 2017
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Application
Dark-Field Inspection Using A Low-Noise Sensor
- Publication number 20170048467
- Publication date Feb 16, 2017
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Application
Scanning Electron Microscope And Methods Of Inspecting And Reviewin...
- Publication number 20160064184
- Publication date Mar 3, 2016
- KLA-Tencor Corporation
- David L. Brown
- H01 - BASIC ELECTRIC ELEMENTS

Devis Contarato

Person

Patents Grantslast 30 patents

Multiple column per channel CCD sensor architecture for inspection...

Dual-column-parallel CCD sensor and inspection systems using a sensor

Scanning electron microscope and methods of inspecting and reviewin...

Dark-field inspection using a low-noise sensor

Dual-column-parallel CCD sensor and inspection systems using a sensor

Scanning electron microscope and methods of inspecting and reviewin...

Patents Applicationslast 30 patents

IMAGE SENSORS WITH A TUNABLE FLOATING DIFFUSION STRUCTURE

Multiple Column Per Channel CCD Sensor Architecture For Inspection...

Dual-Column-Parallel CCD Sensor And Inspection Systems Using A Sensor

Scanning Electron Microscope And Methods Of Inspecting And Reviewin...

Dual-Column-Parallel CCD Sensor And Inspection Systems Using A Sensor

Dark-Field Inspection Using A Low-Noise Sensor

Scanning Electron Microscope And Methods Of Inspecting And Reviewin...