Deyou Fang

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for monitoring an accelerometer
- Patent number 9,297,826
- Issue date Mar 29, 2016
- Freescale Semiconductor Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
Electro-mechanical oscillator and common-mode detection circuit
- Patent number 9,157,945
- Issue date Oct 13, 2015
- Freescale Semiconductor Inc.
- Keith L. Kraver
- G01 - MEASURING TESTING
Information Patent Grant
System and method for improved MEMS oscillator startup
- Patent number 9,118,334
- Issue date Aug 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Mark E. Schlarmann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for monitoring a gyroscope
- Patent number 9,109,901
- Issue date Aug 18, 2015
- Freescale Semiconductor Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing offset variation in multifunction se...
- Patent number 9,103,845
- Issue date Aug 11, 2015
- Freescale Semiconductor Inc.
- Mark E. Schlarmann
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ELECTRO-MECHANICAL OSCILLATOR AND COMMON-MODE DETECTION CIRCUIT
- Publication number 20150061702
- Publication date Mar 5, 2015
- KEITH L. KRAVER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED MEMS OSCILLATOR STARTUP
- Publication number 20140266474
- Publication date Sep 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Mark E. Schlarmann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD FOR MONITORING AN ACCELEROMETER
- Publication number 20140250971
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR REDUCING OFFSET VARIATION IN MULTIFUNCTION SE...
- Publication number 20140251009
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Mark E. SCHLARMANN
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR MONITORING A GYROSCOPE
- Publication number 20140250970
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Deyou FANG
- G01 - MEASURING TESTING