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Deyou Fang
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Frisco, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
Patent number
11,719,540
Issue date
Aug 8, 2023
STMicroelectronics, Inc.
Yamu Hu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
MEMS gyroscope control circuit
Patent number
11,662,205
Issue date
May 30, 2023
STMicroelectronics, Inc.
Deyou Fang
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
Patent number
11,255,670
Issue date
Feb 22, 2022
STMicroelectronics, Inc.
Yamu Hu
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope control circuit
Patent number
11,175,138
Issue date
Nov 16, 2021
STMicroelectronics, Inc.
Deyou Fang
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope start-up process and circuit
Patent number
11,162,790
Issue date
Nov 2, 2021
STMicroelectronics, Inc.
Deyou Fang
G01 - MEASURING TESTING
Information
Patent Grant
Sensing an ICMFB output to detect functional state of a MEMS sensor
Patent number
11,143,670
Issue date
Oct 12, 2021
STMicroelectronics, Inc.
Davy Choi
G01 - MEASURING TESTING
Information
Patent Grant
Cancellation of noise due to capacitance mismatch in MEMS sensors
Patent number
10,274,510
Issue date
Apr 30, 2019
STMicroelectronics, Inc.
Milad Alwardi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
Publication number
20230273024
Publication date
Aug 31, 2023
STMicroelectronics, Inc.
Deyou FANG
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
Publication number
20220128360
Publication date
Apr 28, 2022
STMicroelectronics, Inc.
Yamu HU
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
Publication number
20220034659
Publication date
Feb 3, 2022
STMicroelectronics, Inc.
Deyou FANG
G01 - MEASURING TESTING
Information
Patent Application
SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR
Publication number
20210405085
Publication date
Dec 30, 2021
STMicroelectronics, Inc.
Davy Choi
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
Publication number
20200408525
Publication date
Dec 31, 2020
STMicroelectronics, Inc.
Deyou FANG
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT
Publication number
20200408523
Publication date
Dec 31, 2020
STMicroelectronics, Inc.
Deyou FANG
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
Publication number
20200408524
Publication date
Dec 31, 2020
STMicroelectronics, Inc.
Yamu HU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR
Publication number
20180335446
Publication date
Nov 22, 2018
STMicroelectronics, Inc.
Davy Choi
G01 - MEASURING TESTING
Information
Patent Application
CANCELLATION OF NOISE DUE TO CAPACITANCE MISMATCH IN MEMS SENSORS
Publication number
20170227569
Publication date
Aug 10, 2017
STMicroelectronics, Inc.
Milad Alwardi
G01 - MEASURING TESTING