Deyou Fang

Person

Frisco, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
MEMS gyroscope control circuit
- Patent number 12,111,158
- Issue date Oct 8, 2024
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
Sensing an ICMFB output to detect functional state of a mems sensor
- Patent number 12,092,653
- Issue date Sep 17, 2024
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
- Patent number 11,719,540
- Issue date Aug 8, 2023
- STMicroelectronics, Inc.
- Yamu Hu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
MEMS gyroscope control circuit
- Patent number 11,662,205
- Issue date May 30, 2023
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope self-test using a technique for deflection of the se...
- Patent number 11,255,670
- Issue date Feb 22, 2022
- STMicroelectronics, Inc.
- Yamu Hu
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope control circuit
- Patent number 11,175,138
- Issue date Nov 16, 2021
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
MEMS gyroscope start-up process and circuit
- Patent number 11,162,790
- Issue date Nov 2, 2021
- STMicroelectronics, Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
Sensing an ICMFB output to detect functional state of a MEMS sensor
- Patent number 11,143,670
- Issue date Oct 12, 2021
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Grant
Cancellation of noise due to capacitance mismatch in MEMS sensors
- Patent number 10,274,510
- Issue date Apr 30, 2019
- STMicroelectronics, Inc.
- Milad Alwardi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
- Publication number 20230273024
- Publication date Aug 31, 2023
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
- Publication number 20220128360
- Publication date Apr 28, 2022
- STMicroelectronics, Inc.
- Yamu HU
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
- Publication number 20220034659
- Publication date Feb 3, 2022
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR
- Publication number 20210405085
- Publication date Dec 30, 2021
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE CONTROL CIRCUIT
- Publication number 20200408525
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT
- Publication number 20200408523
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...
- Publication number 20200408524
- Publication date Dec 31, 2020
- STMicroelectronics, Inc.
- Yamu HU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR
- Publication number 20180335446
- Publication date Nov 22, 2018
- STMicroelectronics, Inc.
- Davy Choi
- G01 - MEASURING TESTING
Information Patent Application
CANCELLATION OF NOISE DUE TO CAPACITANCE MISMATCH IN MEMS SENSORS
- Publication number 20170227569
- Publication date Aug 10, 2017
- STMicroelectronics, Inc.
- Milad Alwardi
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

MEMS gyroscope control circuit

Sensing an ICMFB output to detect functional state of a mems sensor

MEMS gyroscope self-test using a technique for deflection of the se...

MEMS gyroscope control circuit

MEMS gyroscope self-test using a technique for deflection of the se...

MEMS gyroscope control circuit

MEMS gyroscope start-up process and circuit

Sensing an ICMFB output to detect functional state of a MEMS sensor

Cancellation of noise due to capacitance mismatch in MEMS sensors

Patents Applicationslast 30 patents

MEMS GYROSCOPE CONTROL CIRCUIT

MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...

MEMS GYROSCOPE CONTROL CIRCUIT

SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR

MEMS GYROSCOPE CONTROL CIRCUIT

MEMS GYROSCOPE START-UP PROCESS AND CIRCUIT

MEMS GYROSCOPE SELF-TEST USING A TECHNIQUE FOR DEFLECTION OF THE SE...

SENSING AN ICMFB OUTPUT TO DETECT FUNCTIONAL STATE OF A MEMS SENSOR

CANCELLATION OF NOISE DUE TO CAPACITANCE MISMATCH IN MEMS SENSORS