Dhananjay Srinivasa Raghavan

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 11,609,262
- Issue date Mar 21, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Delay test circuitry
- Patent number 8,531,196
- Issue date Sep 10, 2013
- Altera Corporation
- Jaydev Amit Shelat
- G01 - MEASURING TESTING
Information Patent Grant
Feature control circuitry for testing integrated circuits
- Patent number 7,301,836
- Issue date Nov 27, 2007
- Altera Corporation
- Dhananjay Srinivasa Raghavan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
- Publication number 20230129176
- Publication date Apr 27, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
- Publication number 20190146028
- Publication date May 16, 2019
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING