Dhiraj Goswami

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Generalized fault model for defects and circuit marginalities
- Patent number 7,036,063
- Issue date Apr 25, 2006
- Intel Corporation
- Sandip Kundu
- G11 - INFORMATION STORAGE
Information Patent Grant
Pre-synthesis test point insertion
- Patent number 6,311,317
- Issue date Oct 30, 2001
- Synopsys, Inc.
- Ajay Khoche
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Generalized fault model for defects and circuit marginalities
- Publication number 20040205436
- Publication date Oct 14, 2004
- Sandip Kundu
- G01 - MEASURING TESTING
Information Patent Application
Generalized fault model for defects and circuit marginalities
- Publication number 20040064773
- Publication date Apr 1, 2004
- Sandip Kundu
- G01 - MEASURING TESTING
Information Patent Application
Simulation-based technique for contention avoidance in automatic te...
- Publication number 20030188273
- Publication date Oct 2, 2003
- Intel Corporation
- Sandip Kundu
- G06 - COMPUTING CALCULATING COUNTING