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Diaa Khalil
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Cairo, EG
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Patents Grants
last 30 patents
Information
Patent Grant
Compact spectral analyzer
Patent number
12,061,116
Issue date
Aug 13, 2024
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Integrated evanescent wave spectral sensing device
Patent number
11,953,377
Issue date
Apr 9, 2024
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Compact material analyzer
Patent number
11,841,268
Issue date
Dec 12, 2023
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Integrated optical probe card and system for batch testing of optic...
Patent number
10,782,342
Issue date
Sep 22, 2020
Si-Ware Systems
Bassam Saadany
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Integrated spectral unit
Patent number
10,060,791
Issue date
Aug 28, 2018
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
High performance parallel spectrometer device
Patent number
9,970,819
Issue date
May 15, 2018
Si-Ware Systems
Diaa Khalil
G01 - MEASURING TESTING
Information
Patent Grant
Structured silicon-based thermal emitter
Patent number
9,793,478
Issue date
Oct 17, 2017
Si-Ware Systems
Yasser M. Sabry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MEMS based ring laser gyroscope with reduced lock-in
Patent number
9,574,880
Issue date
Feb 21, 2017
King Abdulaziz City for Science and Technology
Diaa A. M. Khalil
G01 - MEASURING TESTING
Information
Patent Grant
Integrated apertured micromirror and applications thereof
Patent number
9,557,556
Issue date
Jan 31, 2017
Si-Ware Systems
Yasser M. Sabry
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Ring mirror optical rotation sensor
Patent number
9,476,713
Issue date
Oct 25, 2016
King Abdulaziz City for Science and Technology
Mohamed Yehia Shalaby
G01 - MEASURING TESTING
Information
Patent Grant
Fourier transform micro spectrometer based on spatially-shifted int...
Patent number
9,429,474
Issue date
Aug 30, 2016
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Aspherical optical surfaces and optical scanners
Patent number
9,158,109
Issue date
Oct 13, 2015
Si-Ware Systems
Yasser M. Sabry
G02 - OPTICS
Information
Patent Grant
Integrated monolithic optical bench containing 3-D curved optical e...
Patent number
9,046,690
Issue date
Jun 2, 2015
Si-Ware Systems
Yasser M. Sabry
G02 - OPTICS
Information
Patent Grant
Spatial splitting-based optical MEMS interferometers
Patent number
8,922,787
Issue date
Dec 30, 2014
Si-Ware Systems
Bassem Mortada
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer with variable optical path length reference mirror u...
Patent number
8,792,105
Issue date
Jul 29, 2014
Si-Ware Systems
Diaa A. Khalil
G01 - MEASURING TESTING
Information
Patent Grant
Opto-mechanical optical path retardation multiplier for optical MEM...
Patent number
8,736,843
Issue date
May 27, 2014
Si-Ware Systems
Mostafa Medhat
G02 - OPTICS
Information
Patent Grant
Compensated MEMS FTIR spectrometer architecture
Patent number
8,531,675
Issue date
Sep 10, 2013
Si-Ware Systems, Inc.
Diaa A. Khalil
G01 - MEASURING TESTING
Information
Patent Grant
System, method and apparatus for a micromachined interferometer usi...
Patent number
8,508,745
Issue date
Aug 13, 2013
Si-Ware Systems
Bassam A. Saadany
G01 - MEASURING TESTING
Information
Patent Grant
Ultra-wide angle MEMS scanner architecture
Patent number
8,411,340
Issue date
Apr 2, 2013
Si-Ware Systems
Diaa A. Khalil
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System, method and apparatus for a micromachined interferometer usi...
Patent number
7,796,267
Issue date
Sep 14, 2010
Si-Ware Systems
Bassam Amanallah Saadany
G01 - MEASURING TESTING
Information
Patent Grant
Optical switching matrix and method of fabricating such a matrix
Patent number
6,847,756
Issue date
Jan 25, 2005
Memscap
Diaa Khalil
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
3D PRINTING AUTOMATION ASSISTED BY INTEGRATED ROBOTIC SYSTEM
Publication number
20250042086
Publication date
Feb 6, 2025
Mogassam Inc.
Ahmed Magdy Mohmed Yamany Ali
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
OPTO-ELECTRICAL PROBE CARD PLATFORM FOR WAFER-LEVEL TESTING OF OPTI...
Publication number
20230393173
Publication date
Dec 7, 2023
SI-WARE SYSTEMS
Tarek Mohamed Zeinah
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMPACT SPECTRAL ANALYZER
Publication number
20230036551
Publication date
Feb 2, 2023
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
COMPACT SPECTROSCOPIC ANALYZER DEVICE
Publication number
20220404361
Publication date
Dec 22, 2022
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED EVANESCENT WAVE SPECTRAL SENSING DEVICE
Publication number
20220260419
Publication date
Aug 18, 2022
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
COMPACT MATERIAL ANALYZER
Publication number
20220244101
Publication date
Aug 4, 2022
SI-WARE SYSTEMS
Yasser M. Sabry
G02 - OPTICS
Information
Patent Application
INTEGRATED DEVICE FOR FLUID ANALYSIS
Publication number
20200378892
Publication date
Dec 3, 2020
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED OPTICAL PROBE CARD AND SYSTEM FOR BATCH TESTING OF OPTIC...
Publication number
20180143245
Publication date
May 24, 2018
SI-WARE SYSTEMS
Bassam Saadany
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INTEGRATED SPECTRAL UNIT
Publication number
20170363469
Publication date
Dec 21, 2017
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURED SILICON-BASED THERMAL EMITTER
Publication number
20170012199
Publication date
Jan 12, 2017
SI-WARE SYSTEMS
Yasser M. Sabry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH PERFORMANCE PARALLEL SPECTROMETER DEVICE
Publication number
20160282184
Publication date
Sep 29, 2016
SI-WARE SYSTEMS
Diaa Khalil
G01 - MEASURING TESTING
Information
Patent Application
Ring Mirror Optical Rotation Sensor
Publication number
20150070706
Publication date
Mar 12, 2015
KING ABDULAZIZ CITY FOR SCIENCE AND TECHNOLOGY
Mohamed Yehia Shalaby
G01 - MEASURING TESTING
Information
Patent Application
MEMS BASED SWEPT LASER SOURCE
Publication number
20150010026
Publication date
Jan 8, 2015
SI-WARE SYSTEMS
Bassam A. Saadany
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integrated Apertured Micromirror and Applications Thereof
Publication number
20140268174
Publication date
Sep 18, 2014
SI-WARE SYSTEMS
Yasser M. Sabry
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SPATIAL SPLITTING-BASED OPTICAL MEMS INTERFEROMETERS
Publication number
20140192365
Publication date
Jul 10, 2014
SI-WARE SYSTEMS
Bassem Mortada
G02 - OPTICS
Information
Patent Application
Fourier transform micro spectrometer based on spatially-shifted int...
Publication number
20140098371
Publication date
Apr 10, 2014
SI-WARE SYSTEMS
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Application
Aspherical optical surfaces and optical scanners
Publication number
20140022618
Publication date
Jan 23, 2014
SI-WARE SYSTEMS
Yasser M. Sabry
G02 - OPTICS
Information
Patent Application
Integrated monolithic optical bench containing 3-D curved optical e...
Publication number
20130100424
Publication date
Apr 25, 2013
SI-WARE SYSTEMS
Yasser M. Sabry
G02 - OPTICS
Information
Patent Application
MEMS based Ring Laser Gyroscope with Reduced Lock-in
Publication number
20130083327
Publication date
Apr 4, 2013
KING ABDULAZIZ CITY FOR SCIENCE AND TECHNOLOGY
Diaa A.M. Khalil
G01 - MEASURING TESTING
Information
Patent Application
MEMS BASED SWEPT LASER SOURCE
Publication number
20120320936
Publication date
Dec 20, 2012
SI-WARE SYSTEMS
Bassam A. Saadany
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTERFEROMETER WITH VARIABLE OPTICAL PATH LENGTH REFERENCE MIRROR A...
Publication number
20110176138
Publication date
Jul 21, 2011
SI-WARE SYSTEMS
Diaa Khalil
G01 - MEASURING TESTING
Information
Patent Application
Compensated MEMS FTIR Spectrometer Architecture
Publication number
20110058180
Publication date
Mar 10, 2011
SI-WARE SYSTEMS
Diaa A. Khalil
G01 - MEASURING TESTING
Information
Patent Application
System, Method and Apparatus for a Micromachined Interferometer Usi...
Publication number
20100315647
Publication date
Dec 16, 2010
SI-WARE SYSTEMS
Bassam A. Saadany
G02 - OPTICS
Information
Patent Application
OPTO-MECHANICAL OPTICAL PATH RETARDATION MULTIPLIER FOR OPTICAL MEM...
Publication number
20100265512
Publication date
Oct 21, 2010
SI-WARE SYSTEMS
MOSTAFA MEDHAT
G02 - OPTICS
Information
Patent Application
ULTRA-WIDE ANGLE MEMS SCANNER ARCHITECTURE
Publication number
20100265382
Publication date
Oct 21, 2010
SI-WARE SYSTEMS
DIAA A. KHALIL
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
System, method and apparatus for a micromachined interferometer usi...
Publication number
20080080034
Publication date
Apr 3, 2008
Bassam Amanallah Saadany
G02 - OPTICS
Information
Patent Application
Optical switching matrix and method of fabricating such a matrix
Publication number
20030194172
Publication date
Oct 16, 2003
MEMSCAP
Diaa Khalil
G02 - OPTICS