Diana Mattiza

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Alignment mark for coarse alignment and fine alignment of a semicon...
- Patent number 7,245,351
- Issue date Jul 17, 2007
- Infineon Technologies, AG
- Diana Mattiza
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for measuring a characteristic dimension of at least one pat...
- Patent number 6,980,304
- Issue date Dec 27, 2005
- Infineon Technologies, AG
- Oliver Broermann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Alignment mark for coarse alignment and fine alignment of a semicon...
- Publication number 20050068508
- Publication date Mar 31, 2005
- Diana Mattiza
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for measuring a characteristic dimension of at least one pat...
- Publication number 20040201858
- Publication date Oct 14, 2004
- Oliver Broermann
- G01 - MEASURING TESTING