Dick Herlein

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Driver circuits for IC tester
- Patent number 5,430,400
- Issue date Jul 4, 1995
- Schlumberger Technologies Inc.
- Richard F. Herlein
- G01 - MEASURING TESTING
Information Patent Grant
Test period generator for automatic test equipment
- Patent number 4,849,702
- Issue date Jul 18, 1989
- Schlumberger Techologies, Inc.
- Burnell G. West
- G11 - INFORMATION STORAGE
Information Patent Grant
Delay line control system for automatic test equipment
- Patent number 4,837,521
- Issue date Jun 6, 1989
- Schlumberger Systems and Services, Inc.
- Richard F. Herlein
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for dynamically controlling the timing of sign...
- Patent number 4,820,944
- Issue date Apr 11, 1989
- Schlumberger Systems and Services, Inc.
- Richard F. Herlein
- G11 - INFORMATION STORAGE
Information Patent Grant
Control of signal timing apparatus in automatic test systems using...
- Patent number 4,789,835
- Issue date Dec 6, 1988
- Fairchild Camera and Instrument Corporation
- Richard F. Herlein
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for dynamically controlling the timing of sign...
- Patent number 4,675,562
- Issue date Jun 23, 1987
- Fairchild Semiconductor Corporation
- Richard F. Herlein
- G01 - MEASURING TESTING
Information Patent Grant
Formatter for high speed test system
- Patent number 4,635,256
- Issue date Jan 6, 1987
- Fairchild Semiconductor Corporation
- Richard F. Herlein
- G01 - MEASURING TESTING
Information Patent Grant
Deskewing time-critical signals in automatic test equipment
- Patent number 4,511,846
- Issue date Apr 16, 1985
- Fairchild Camera and Instrument Corporation
- Alex Nagy
- G01 - MEASURING TESTING

Dick Herlein

Person

Patents Grantslast 30 patents

Driver circuits for IC tester

Test period generator for automatic test equipment

Delay line control system for automatic test equipment

Method and apparatus for dynamically controlling the timing of sign...

Control of signal timing apparatus in automatic test systems using...

Method and apparatus for dynamically controlling the timing of sign...

Formatter for high speed test system

Deskewing time-critical signals in automatic test equipment