Dick James

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Carp, CA

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Patents Grantslast 30 patents

Information Patent Grant
Automatic focused ion beam imaging system and method
- Patent number 6,453,063
- Issue date Sep 17, 2002
- Chipworks
- Michael Phaneuf
- G01 - MEASURING TESTING
Information Patent Grant
Automated method of circuit analysis
- Patent number 6,288,393
- Issue date Sep 11, 2001
- Chipworks
- Michael Phaneuf
- G01 - MEASURING TESTING