Dick Kuiper

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Almelo, NL

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Patents Grantslast 30 patents

Information Patent Grant
Quantitative X-ray analysis—matrix thickness correction
- Patent number 9,784,699
- Issue date Oct 10, 2017
- PANalytical B.V.
- Charalampos Zarkadas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Quantitative X-ray Analysis - Matrix thickness correction
- Publication number 20160258890
- Publication date Sep 8, 2016
- PANALYTICAL B.V.
- Charalampos Zarkadas
- G01 - MEASURING TESTING