Diederik Jan Maas

Person

Breda, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Lithographic patterning method
- Patent number 11,977,337
- Issue date May 7, 2024
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Diederik Jan Maas
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method for atomic layer deposition
- Patent number 11,549,180
- Issue date Jan 10, 2023
- Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
- Diederik Jan Maas
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Radiation sensor device for high energy photons
- Patent number 10,014,165
- Issue date Jul 3, 2018
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Diederik Jan Maas
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for depositing atomic layers on a substrate
- Patent number 9,567,671
- Issue date Feb 14, 2017
- Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
- Raymond Jacobus Wilhelmus Knaapen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Lithographic apparatus and device manufacturing method
- Patent number 8,896,809
- Issue date Nov 25, 2014
- ASML Netherlands B.V.
- Judocus Marie Dominicus Stoeldraijer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Sample preparation
- Patent number 8,624,185
- Issue date Jan 7, 2014
- Carl Zeiss Microscopy, LLC
- Diederik Jan Maas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithographic projection apparatus and method of compensating pertur...
- Patent number 8,570,489
- Issue date Oct 29, 2013
- ASML Netherlands B.V.
- Jan Bernard Plechelmus Van Schoot
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for determining lens errors in a particle-optical device
- Patent number 7,518,121
- Issue date Apr 14, 2009
- FEI Company
- Diederik Jan Maas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical inspection device especially for semiconductor wafers
- Patent number 6,693,278
- Issue date Feb 17, 2004
- FEI Company
- Diederik Jan Maas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...
- Publication number 20240410827
- Publication date Dec 12, 2024
- ASML NETHERLANDS B.V.
- Diederik Jan MAAS
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHIC PATTERNING METHOD AND SYSTEM THEREFORE
- Publication number 20220057720
- Publication date Feb 24, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Diederik Jan MAAS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHIC PATTERNING METHOD
- Publication number 20220026816
- Publication date Jan 27, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Diederik Jan MAAS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
A RADIATION SENSOR DEVICE FOR HIGH ENERGY PHOTONS
- Publication number 20170092474
- Publication date Mar 30, 2017
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Diederik Jan Maas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DEPOSITING ATOMIC LAYERS ON A SUBSTRATE
- Publication number 20150086715
- Publication date Mar 26, 2015
- Nederlandse Organisatie voor toegepast- natuurwetenschappelijk Onderzoek TNO
- Raymond Jacobus Wilhelmus Knaapen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SURFACE CLEANING DEVICE AND A METHOD OF CLEANING A SURFACE
- Publication number 20140373868
- Publication date Dec 25, 2014
- Norbertus Benedictus Koster
- B08 - CLEANING
Information Patent Application
SAMPLE PREPARATION
- Publication number 20120199737
- Publication date Aug 9, 2012
- CARL ZEISS NTS, LLC.
- Diederik Jan Maas
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ATOMIC LAYER DEPOSITION
- Publication number 20120003396
- Publication date Jan 5, 2012
- Nederlandse Organisatie voor toegepast-natuurweten schappelijk Onderzoek TNO
- Diederik Jan Maas
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
LITHOGRAPHIC PROJECTION APPARATUS AND METHOD OF COMPENSATING PERTUR...
- Publication number 20100321657
- Publication date Dec 23, 2010
- ASML NETHERLANDS B.V.
- Jan Bernard Plechelmus VAN SCHOOT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic apparatus and device manufacturing method
- Publication number 20090047604
- Publication date Feb 19, 2009
- ASML NETHERLANDS B.V.
- Judocus Marie Dominicus Stoeldraijer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for determining lens errors in a particle-optical device
- Publication number 20070045558
- Publication date Mar 1, 2007
- FEI Company
- Diederik Jan Maas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-optical inspection device especially for semiconductor wafers
- Publication number 20020079447
- Publication date Jun 27, 2002
- Diederik Jan Maas
- G01 - MEASURING TESTING

Diederik Jan Maas

Person

Patents Grantslast 30 patents

Lithographic patterning method

Apparatus and method for atomic layer deposition

Radiation sensor device for high energy photons

Method and apparatus for depositing atomic layers on a substrate

Lithographic apparatus and device manufacturing method

Sample preparation

Lithographic projection apparatus and method of compensating pertur...

Method for determining lens errors in a particle-optical device

Particle-optical inspection device especially for semiconductor wafers

Patents Applicationslast 30 patents

METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...

LITHOGRAPHIC PATTERNING METHOD AND SYSTEM THEREFORE

LITHOGRAPHIC PATTERNING METHOD

A RADIATION SENSOR DEVICE FOR HIGH ENERGY PHOTONS

METHOD AND APPARATUS FOR DEPOSITING ATOMIC LAYERS ON A SUBSTRATE

SURFACE CLEANING DEVICE AND A METHOD OF CLEANING A SURFACE

SAMPLE PREPARATION

APPARATUS AND METHOD FOR ATOMIC LAYER DEPOSITION

LITHOGRAPHIC PROJECTION APPARATUS AND METHOD OF COMPENSATING PERTUR...

Lithographic apparatus and device manufacturing method

Method for determining lens errors in a particle-optical device

Particle-optical inspection device especially for semiconductor wafers