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Diego E. Serrano
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Peachtree City, GA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Sensing device
Patent number
11,725,941
Issue date
Aug 15, 2023
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Amir Rahafrooz
G01 - MEASURING TESTING
Information
Patent Grant
Sensing device
Patent number
11,614,328
Issue date
Mar 28, 2023
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Sagnik Pal
G01 - MEASURING TESTING
Information
Patent Grant
Calibration system, and sensor system including the same
Patent number
11,125,579
Issue date
Sep 21, 2021
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Ronald Joseph Lipka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for electrostatic mode-alignment on planar MEM...
Patent number
10,082,394
Issue date
Sep 25, 2018
Panasonic Corporation
Amir Rahafrooz
G01 - MEASURING TESTING
Information
Patent Grant
Tunable Piezoelectric MEMS Resonators suitable for real-time clock...
Patent number
8,450,913
Issue date
May 28, 2013
Georgia Tech Research Corporation
Farrokh Ayazi
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
SENSING DEVICE
Publication number
20220349712
Publication date
Nov 3, 2022
Panasonic Intellectual Property Management Co., Ltd.
Sagnik PAL
G01 - MEASURING TESTING
Information
Patent Application
SENSING DEVICE
Publication number
20220316881
Publication date
Oct 6, 2022
Panasonic Intellectual Property Management Co., Ltd.
Amir RAHAFROOZ
G01 - MEASURING TESTING
Information
Patent Application
SENSING DEVICE
Publication number
20220128359
Publication date
Apr 28, 2022
Panasonic Intellectual Property Management Co., Ltd.
Sagnik PAL
G01 - MEASURING TESTING
Information
Patent Application
SENSING DEVICE
Publication number
20220107181
Publication date
Apr 7, 2022
Panasonic Intellectual Property Management Co., Ltd.
Amir RAHAFROOZ
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION SYSTEM, AND SENSOR SYSTEM INCLUDING THE SAME
Publication number
20200309563
Publication date
Oct 1, 2020
Panasonic Intellectual Property Management Co., Ltd.
Ronald Joseph Lipka
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Electrostatic Mode-Alignment on Planar MEM...
Publication number
20160349055
Publication date
Dec 1, 2016
QUALTRE, INC.
Amir Rahafrooz
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DECOUPLING ENVIRONMENTAL AND MODAL DEPENDE...
Publication number
20160327390
Publication date
Nov 10, 2016
QUALTRE, INC.
Diego E. Serrano
G01 - MEASURING TESTING