Dieter Kantz

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Hennigsdorf, DE

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Patents Grantslast 30 patents

Information Patent Grant
Test configuration for the functional testing of a semiconductor chip
- Patent number 6,825,682
- Issue date Nov 30, 2004
- Infineon Technologies AG
- Dieter Kantz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test configuration for the functional testing of a semiconductor chip
- Publication number 20010043078
- Publication date Nov 22, 2001
- Dieter Kantz
- G01 - MEASURING TESTING