Dieter Lipp

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Goerlitz, DE

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Patents Grantslast 30 patents

Information Patent Grant
Test structures and method of forming an according test structure
- Patent number 9,673,115
- Issue date Jun 6, 2017
- GLOBALFOUNDRIES Inc.
- Hans-Peter Moll
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit decoupling capacitor arrangement
- Patent number 8,610,188
- Issue date Dec 17, 2013
- GLOBALFOUNDRIES, INC.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURES AND METHOD OF FORMING AN ACCORDING TEST STRUCTURE
- Publication number 20170133287
- Publication date May 11, 2017
- GLOBALFOUNDRIES INC.
- Hans-Peter Moll
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT
- Publication number 20140110772
- Publication date Apr 24, 2014
- GLOBALFOUNDRIES, Inc.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DECOUPLING CAPACITOR ARRANGEMENT
- Publication number 20130069131
- Publication date Mar 21, 2013
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS