Dieter Michel

Person

Traunstein, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Rotary position measuring system
- Patent number 6,885,457
- Issue date Apr 26, 2005
- Dr. Johannes Heidenhein GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Integrated optoelectronic thin-film sensor and method of producing...
- Patent number 6,621,104
- Issue date Sep 16, 2003
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic component with a space kept free from underfiller
- Patent number 6,605,828
- Issue date Aug 12, 2003
- Dr. Johanns Hudenheim GmbH
- Günter Schwarzrock
- G01 - MEASURING TESTING
Information Patent Grant
Optical detector for measuring relative displacement of an object o...
- Patent number 6,486,467
- Issue date Nov 26, 2002
- Dr. Johannes Heiden Hain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Scale and method for making a scale
- Patent number 5,880,882
- Issue date Mar 9, 1999
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Interferential position measuring device with three detectors
- Patent number 5,760,959
- Issue date Jun 2, 1998
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Absolute interferometer measuring process and apparatus having a me...
- Patent number 5,631,736
- Issue date May 20, 1997
- Dr. Johannes Heidenhain GmbH
- Jurgen Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Graduation scale having a continuous planar surface with a protecti...
- Patent number 5,559,599
- Issue date Sep 24, 1996
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G02 - OPTICS
Information Patent Grant
Apparatus and method for measuring absolute measurements having two...
- Patent number 5,521,704
- Issue date May 28, 1996
- Jurgen Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide type displacement interferometer having two reference paths
- Patent number 5,396,328
- Issue date Mar 7, 1995
- Dr. Johannes Heidenhain GmbH
- Dieter Jestel
- G01 - MEASURING TESTING
Information Patent Grant
Polarizing interferometric displacement measuring arrangement
- Patent number 5,333,048
- Issue date Jul 26, 1994
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method having at least one waveguide coupler to creat...
- Patent number 5,162,869
- Issue date Nov 10, 1992
- Johannes Heidenhain GmbH
- Dieter Michel
- G02 - OPTICS
Information Patent Grant
Integrated optical sensor arrangement with detecting means, and mea...
- Patent number 5,113,066
- Issue date May 12, 1992
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G02 - OPTICS
Information Patent Grant
Position measuring apparatus with reflection
- Patent number 5,079,418
- Issue date Jan 7, 1992
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric position measuring arrangement
- Patent number 5,061,073
- Issue date Oct 29, 1991
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Angle measuring arrangement
- Patent number 5,001,340
- Issue date Mar 19, 1991
- Dr. Johannes Heidenhain GmbH
- Ernst Schwefel
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric angle measuring device with adjacent order interference
- Patent number 4,988,864
- Issue date Jan 29, 1991
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric measuring system with integrated optical circuit incl...
- Patent number 4,955,718
- Issue date Sep 11, 1990
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Defraction photoelectric position measuring system
- Patent number 4,923,300
- Issue date May 8, 1990
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric length and angle measuring device
- Patent number 4,843,237
- Issue date Jun 27, 1989
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric measuring system
- Patent number 4,778,273
- Issue date Oct 18, 1988
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric position measuring instrument with grids
- Patent number 4,766,310
- Issue date Aug 23, 1988
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric measuring system
- Patent number 4,677,293
- Issue date Jun 30, 1987
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 4,512,083
- Issue date Apr 23, 1985
- Dr. Johannes Heidenhain GmbH
- Walter Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating exposure masks
- Patent number 4,505,580
- Issue date Mar 19, 1985
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for measuring projectile velocity
- Patent number 4,253,020
- Issue date Feb 24, 1981
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING

Dieter Michel

Person

Patents Grantslast 30 patents

Rotary position measuring system

Integrated optoelectronic thin-film sensor and method of producing...

Optoelectronic component with a space kept free from underfiller

Optical detector for measuring relative displacement of an object o...

Scale and method for making a scale

Interferential position measuring device with three detectors

Absolute interferometer measuring process and apparatus having a me...

Graduation scale having a continuous planar surface with a protecti...

Apparatus and method for measuring absolute measurements having two...

Waveguide type displacement interferometer having two reference paths

Polarizing interferometric displacement measuring arrangement

Apparatus and method having at least one waveguide coupler to creat...

Integrated optical sensor arrangement with detecting means, and mea...

Position measuring apparatus with reflection

Photoelectric position measuring arrangement

Angle measuring arrangement

Photoelectric angle measuring device with adjacent order interference

Photoelectric measuring system with integrated optical circuit incl...

Defraction photoelectric position measuring system

Photoelectric length and angle measuring device

Photoelectric measuring system

Photoelectric position measuring instrument with grids

Photoelectric measuring system

Measuring apparatus

Method and apparatus for generating exposure masks

Apparatus for measuring projectile velocity