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Dieter Wilk
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Haze and defect distribution and aperture configuration in surface...
Patent number
10,088,345
Issue date
Oct 2, 2018
KLA-Tencor Corporation
Chuanyong Huang
G01 - MEASURING TESTING
Information
Patent Grant
System and method for apodization in a semiconductor device inspect...
Patent number
9,645,093
Issue date
May 9, 2017
KLA-Tencor Corporation
Jamie M. Sullivan
G02 - OPTICS
Information
Patent Grant
System and method for apodization in a semiconductor device inspect...
Patent number
9,176,069
Issue date
Nov 3, 2015
KLA-Tencor Corporation
Jamie M. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional UV compatible programmable spatial filter
Patent number
6,686,995
Issue date
Feb 3, 2004
KLA-Tencor Technologies Corporation
Dieter E. Wilk
G01 - MEASURING TESTING
Information
Patent Grant
UV compatible programmable spatial filter
Patent number
6,686,994
Issue date
Feb 3, 2004
KLA-Tencor Technologies Corporation
Dieter Wilk
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HIGH DEFINITION MOLECULAR ARRAY FEATURE GENERATION USING PHOTORESIST
Publication number
20240076656
Publication date
Mar 7, 2024
10X Genomics, Inc.
David Michael PATTERSON
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
COMPOSITIONS AND METHODS FOR GENERATING MOLECULAR ARRAYS USING OLIG...
Publication number
20240026444
Publication date
Jan 25, 2024
10X Genomics, Inc.
Steven William SHORT
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
MOLECULAR ARRAY GENERATION USING PHOTORESIST
Publication number
20220228210
Publication date
Jul 21, 2022
10X Genomics, Inc.
David Michael PATTERSON
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
Publication number
20160054232
Publication date
Feb 25, 2016
KLA-Tencor Corporation
Jamie M. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
Publication number
20140016125
Publication date
Jan 16, 2014
KLA-Tencor Corporation
Jamie M. Sullivan
G02 - OPTICS
Information
Patent Application
TWO-DIMENSIONAL UV COMPATIBLE PROGRAMMABLE SPATIAL FILTER
Publication number
20040001198
Publication date
Jan 1, 2004
KLA-Tencor Technologies Corporation
Dieter E. Wilk
G02 - OPTICS
Information
Patent Application
UV compatible programmable spatial filter
Publication number
20030184739
Publication date
Oct 2, 2003
KLA-Tencor Technologies Corporation
Dieter E. Wilk
G02 - OPTICS