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Dieter Winkler
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Muenchen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method of influencing a charged particle beam, multipole device, an...
Patent number
11,501,946
Issue date
Nov 15, 2022
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus, multi-beamlet assembly, and method...
Patent number
11,495,433
Issue date
Nov 8, 2022
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device and method for inspecting and/or imagi...
Patent number
11,239,043
Issue date
Feb 1, 2022
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of operating a charged particle gun, charged particle gun, a...
Patent number
11,232,924
Issue date
Jan 25, 2022
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device and method for inspecting and/or imagi...
Patent number
11,183,361
Issue date
Nov 23, 2021
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device, interchangeable multi-aperture arrang...
Patent number
10,978,270
Issue date
Apr 13, 2021
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of operating a charged particle gun, charged particle gun, a...
Patent number
10,861,666
Issue date
Dec 8, 2020
ICT Integrated Circuit Testing Gesellschaft für Halbletterprüftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for operating a charged particle device with mult...
Patent number
10,748,743
Issue date
Aug 18, 2020
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device, multi-beam blanker for a charged part...
Patent number
10,593,509
Issue date
Mar 17, 2020
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device, multi-beam blanker for a charged part...
Patent number
10,483,080
Issue date
Nov 19, 2019
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device, charged particle beam influencing dev...
Patent number
10,249,472
Issue date
Apr 2, 2019
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for imaging a secondary charged particle beam wit...
Patent number
10,103,004
Issue date
Oct 16, 2018
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Matthias Firnkes
G01 - MEASURING TESTING
Information
Patent Grant
System for imaging a secondary charged particle beam with adaptive...
Patent number
9,953,805
Issue date
Apr 24, 2018
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Matthias Firnkes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic multipole device, electrostatic multipole arrangement...
Patent number
9,754,759
Issue date
Sep 5, 2017
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic multipole device, electrostatic multipole arrangement...
Patent number
9,620,329
Issue date
Apr 11, 2017
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device with dynamic focus and method of opera...
Patent number
9,431,210
Issue date
Aug 30, 2016
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-beam system for high throughput EBI
Patent number
9,035,249
Issue date
May 19, 2015
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Jürgen Frosien
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Switchable multi perspective detector, optics therefore and method...
Patent number
8,963,083
Issue date
Feb 24, 2015
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Matthias Firnkes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ultra high precision measurement tool
Patent number
8,785,849
Issue date
Jul 22, 2014
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnick mbH
Juergen Frosien
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High resolution gas field ion column with reduced sample load
Patent number
8,735,847
Issue date
May 27, 2014
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Helmut Banzhof
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Switchable multi perspective detector, optics therefor and method o...
Patent number
8,723,117
Issue date
May 13, 2014
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Stefan Lanio
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Shielding member having a charge control electrode, and a charged p...
Patent number
8,563,927
Issue date
Oct 22, 2013
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Charged particle source with automated tip formation
Patent number
8,330,130
Issue date
Dec 11, 2012
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High resolution gas field ion column
Patent number
8,158,939
Issue date
Apr 17, 2012
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Juergen Frosien
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stable emission gas ion source and method for operation thereof
Patent number
8,143,589
Issue date
Mar 27, 2012
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Modular gas ion source
Patent number
8,101,922
Issue date
Jan 24, 2012
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas ion source with high mechanical stability
Patent number
8,044,370
Issue date
Oct 25, 2011
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dieter Winkler
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Dual mode gas field ion source
Patent number
8,026,492
Issue date
Sep 27, 2011
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Juergen Frosien
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-function module for an electron beam column
Patent number
7,800,075
Issue date
Sep 21, 2010
Benyamin Buller
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Charged particle beam device with a gas field ion source and a gas...
Patent number
7,692,165
Issue date
Apr 6, 2010
ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE BEAM DEVICE
Publication number
20220392735
Publication date
Dec 8, 2022
Pieter Kruit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS, MULTI-BEAMLET ASSEMBLY, AND METHOD...
Publication number
20220336186
Publication date
Oct 20, 2022
lCT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF INFLUENCING A CHARGED PARTICLE BEAM, MULTIPOLE DEVICE, AN...
Publication number
20220277921
Publication date
Sep 1, 2022
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGI...
Publication number
20210366686
Publication date
Nov 25, 2021
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGI...
Publication number
20210366683
Publication date
Nov 25, 2021
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF OPERATING A CHARGED PARTICLE GUN, CHARGED PARTICLE GUN, A...
Publication number
20210241990
Publication date
Aug 5, 2021
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BEAM SPLITTER FOR A CHARGED PARTICLE DEVICE
Publication number
20200303156
Publication date
Sep 24, 2020
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR OPERATING A CHARGED PARTICLE DEVICE WITH MULT...
Publication number
20200258714
Publication date
Aug 13, 2020
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE, INTERCHANGEABLE MULTI-APERTURE ARRANG...
Publication number
20200203116
Publication date
Jun 25, 2020
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE, MULTI-BEAM BLANKER FOR A CHARGED PART...
Publication number
20200027687
Publication date
Jan 23, 2020
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM INFLUENCING DEV...
Publication number
20190019649
Publication date
Jan 17, 2019
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROSTATIC MULTIPOLE DEVICE, ELECTROSTATIC MULTIPOLE ARRANGEMENT...
Publication number
20170148609
Publication date
May 25, 2017
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM FOR IMAGING A SECONDARY CHARGED PARTICLE BEAM WITH ADAPTIVE...
Publication number
20170076910
Publication date
Mar 16, 2017
ICT Integrated Circuit Testing Gesellscaft für Halbleiterprüftechnik mbH
Matthias Firnkes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR IMAGING A SECONDARY CHARGED PARTICLE BEAM WIT...
Publication number
20170003235
Publication date
Jan 5, 2017
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Matthias Firnkes
G01 - MEASURING TESTING
Information
Patent Application
SECONDARY ELECTRON OPTICS AND DETECTION DEVICE
Publication number
20150228452
Publication date
Aug 13, 2015
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Stefan LANIO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERA...
Publication number
20150213998
Publication date
Jul 30, 2015
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-BEAM SYSTEM FOR HIGH THROUGHPUT EBI
Publication number
20150155134
Publication date
Jun 4, 2015
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Jürgen FROSIEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SWITCHABLE MULTI PERSPECTIVE DETECTOR, OPTICS THEREFORE AND METHOD...
Publication number
20150021474
Publication date
Jan 22, 2015
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Matthias FIRNKES
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SECONDARY ELECTRON OPTICS AND DETECTION DEVICE
Publication number
20140175277
Publication date
Jun 26, 2014
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Stefan Lanio
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SWITCHABLE MULTI PERSPECTIVE DETECTOR, OPTICS THEREFOR AND METHOD O...
Publication number
20130270438
Publication date
Oct 17, 2013
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Stefan LANIO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERA...
Publication number
20130214155
Publication date
Aug 22, 2013
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SHIELDING MEMBER HAVING A CHARGE CONTROL ELECTRODE, AND A CHARGED P...
Publication number
20130026385
Publication date
Jan 31, 2013
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Dieter WINKLER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
GAS ION SOURCE WITH HIGH MECHANICAL STABILITY
Publication number
20110315890
Publication date
Dec 29, 2011
DIETER WINKLER
F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information
Patent Application
HIGH RESOLUTION GAS FIELD ION COLUMN
Publication number
20100187436
Publication date
Jul 29, 2010
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
JUERGEN FROSIEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DUAL MODE GAS FIELD ION SOURCE
Publication number
20100108902
Publication date
May 6, 2010
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
JUERGEN FROSIEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF PREPARING AN ULTRA SHARP TIP, APPARATUS FOR PREPARING AN...
Publication number
20100006447
Publication date
Jan 14, 2010
ICT, INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUEFTECHNIK MBH
Dieter WINKLER
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ULTRA HIGH PRECISION MEASUREMENT TOOL
Publication number
20090289185
Publication date
Nov 26, 2009
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Juergen FROSIEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Stable Emission Gas Ion Source and Method for Operation Thereof
Publication number
20090260112
Publication date
Oct 15, 2009
Dieter WINKLER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH RESOLUTION GAS FIELD ION COLUMN WITH REDUCED SAMPLE LOAD
Publication number
20090146074
Publication date
Jun 11, 2009
ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
Helmut BANZHOF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE SOURCE WITH AUTOMATED TIP FORMATION
Publication number
20090121160
Publication date
May 14, 2009
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS