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Dietmar DONITZ
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Aalen, DE
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Patents Grants
last 30 patents
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Patent Grant
Particle beam device having a detector arrangement
Patent number
8,901,510
Issue date
Dec 2, 2014
Carl Zeiss Microscopy GmbH
Dietmar Dönitz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam analysis while part of a sample to be analyze...
Patent number
8,502,142
Issue date
Aug 6, 2013
Carl Zeiss Microscopy GmbH
Ulrike Zeile
G01 - MEASURING TESTING
Information
Patent Grant
Positioning device for a particle beam apparatus
Patent number
8,283,641
Issue date
Oct 9, 2012
Carl Zeiss NTS GmbH
Dietmar Dönitz
B08 - CLEANING
Patents Applications
last 30 patents
Information
Patent Application
PARTICLE BEAM DEVICE HAVING A DETECTOR ARRANGEMENT
Publication number
20120286159
Publication date
Nov 15, 2012
Dietmar DÖNITZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Device and method for analyzing a sample
Publication number
20100133432
Publication date
Jun 3, 2010
Ulrike Zeile
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING DEVICE FOR A PARTICLE BEAM APPARATUS
Publication number
20100044566
Publication date
Feb 25, 2010
Dietmar DONITZ
B08 - CLEANING