Dietmar Schmidt

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Bibra, DE

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation circuit for an optoelectronic detector and method for re...
- Patent number 9,377,405
- Issue date Jun 28, 2016
- Carl Zeiss Microscopy GmbH
- Gunter Möhler
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating images with an expanded dynamic range and opt...
- Patent number 8,633,430
- Issue date Jan 21, 2014
- Carl Zeiss Microscophy GmbH
- Gunter Möhler
- G01 - MEASURING TESTING
Information Patent Grant
Microscope
- Patent number 8,420,992
- Issue date Apr 16, 2013
- Carl Zeiss MicroImaging GmbH
- Peter Kuehn
- G02 - OPTICS
Information Patent Grant
Method and arrangement for detecting light signals
- Patent number 7,859,673
- Issue date Dec 28, 2010
- Carl Zeiss MicroImaging GmbH
- Gunter Moehler
- G01 - MEASURING TESTING
Information Patent Grant
Device for examining samples
- Patent number 6,823,079
- Issue date Nov 23, 2004
- Carl Zeiss Jena GmbH
- Johannes Winterot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Evaluation Circuit for an Optoelectronic Detector and Method for Re...
- Publication number 20140231675
- Publication date Aug 21, 2014
- Gunter Möhler
- G02 - OPTICS
Information Patent Application
Method for Generating Images with an Expanded Dynamic Range and Opt...
- Publication number 20120205519
- Publication date Aug 16, 2012
- Carl Zeiss Microlmaging GmbH
- Gunter Möhler
- G02 - OPTICS
Information Patent Application
MICROSCOPE
- Publication number 20110090561
- Publication date Apr 21, 2011
- Peter KUEHN
- G02 - OPTICS
Information Patent Application
Method and arrangement for detecting light signals
- Publication number 20080008479
- Publication date Jan 10, 2008
- Gunter Moehler
- G02 - OPTICS