Dileep Agnihotri

Person

Round Rock, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Membranes with polydopamine coatings
- Patent number 10,518,226
- Issue date Dec 31, 2019
- Dileep Agnihotri
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Accurate measurement of layer dimensions using XRF
- Patent number 7,804,934
- Issue date Sep 28, 2010
- Jordan Valley Semiconductors Ltd.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Grant
X-ray measurement of properties of nano-particles
- Patent number 7,680,243
- Issue date Mar 16, 2010
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Automated selection of X-ray reflectometry measurement locations
- Patent number 7,649,978
- Issue date Jan 19, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of X-ray reflectometry system
- Patent number 7,474,732
- Issue date Jan 6, 2009
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry of thin film layers with enhanced accuracy
- Patent number 7,130,376
- Issue date Oct 31, 2006
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Material analysis using multiple X-ray reflectometry models
- Patent number 7,103,142
- Issue date Sep 5, 2006
- Jordan Valley Applied Radiation Ltd.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry of thin film layers with enhanced accuracy
- Patent number 7,062,013
- Issue date Jun 13, 2006
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED ULTRAFILTRATION AND REVERSE OSMOSIS DESALINATION SYSTEMS
- Publication number 20150375174
- Publication date Dec 31, 2015
- ADVANCED HYDRO INC
- Dileep AGNIHOTRI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MEMBRANES WITH POLYDOPAMINE COATINGS
- Publication number 20140054221
- Publication date Feb 27, 2014
- ADVANCED HYDRO INC
- Dileep Agnihotri
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ELECTROPHORETIC DEPOSITION AND REDUCTION OF GRAPHENE OXIDE TO MAKE...
- Publication number 20110227000
- Publication date Sep 22, 2011
- Rodney S. Ruoff
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Ionic Liquids for Use in Ultracapacitor and Graphene-Based Ultracap...
- Publication number 20110080689
- Publication date Apr 7, 2011
- Christopher W. Bielawski
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Automated selection of x-ray reflectometry measurement locations
- Publication number 20090074141
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF
- Publication number 20090074137
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Application
X-ray measurement of properties of nano-particles
- Publication number 20090067573
- Publication date Mar 12, 2009
- JORDAN VALLEY SEMICONDUCTORS
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Accurate measurement of layer dimensions using XRF
- Publication number 20080049895
- Publication date Feb 28, 2008
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL ANALYSIS USING MULTIPLE X-RAY REFLECTOMETRY MODELS
- Publication number 20060188062
- Publication date Aug 24, 2006
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Application
X-ray reflectometry of thin film layers with enhanced accuracy
- Publication number 20060153333
- Publication date Jul 13, 2006
- David Berman
- G01 - MEASURING TESTING
Information Patent Application
Calibration of X-ray reflectometry system
- Publication number 20060115046
- Publication date Jun 1, 2006
- David Berman
- G01 - MEASURING TESTING

Dileep Agnihotri

Person

Patents Grantslast 30 patents

Membranes with polydopamine coatings

Accurate measurement of layer dimensions using XRF

X-ray measurement of properties of nano-particles

Automated selection of X-ray reflectometry measurement locations

Calibration of X-ray reflectometry system

X-ray reflectometry of thin film layers with enhanced accuracy

Material analysis using multiple X-ray reflectometry models

X-ray reflectometry of thin film layers with enhanced accuracy

Patents Applicationslast 30 patents

INTEGRATED ULTRAFILTRATION AND REVERSE OSMOSIS DESALINATION SYSTEMS

MEMBRANES WITH POLYDOPAMINE COATINGS

ELECTROPHORETIC DEPOSITION AND REDUCTION OF GRAPHENE OXIDE TO MAKE...

Ionic Liquids for Use in Ultracapacitor and Graphene-Based Ultracap...

Automated selection of x-ray reflectometry measurement locations

ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF

X-ray measurement of properties of nano-particles

Accurate measurement of layer dimensions using XRF

MATERIAL ANALYSIS USING MULTIPLE X-RAY REFLECTOMETRY MODELS

X-ray reflectometry of thin film layers with enhanced accuracy

Calibration of X-ray reflectometry system