Dimitra GKOROU

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method for determining an inspection strategy for a group of substr...
- Patent number 11,740,560
- Issue date Aug 29, 2023
- ASML Netherlands B.V.
- Eleftherios Koulierakis
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Extracting a feature from a data set
- Patent number 11,579,534
- Issue date Feb 14, 2023
- ASML Netherlands B.V.
- Maialen Larranaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing an apparatus for multi-stage processing of product units
- Patent number 11,520,238
- Issue date Dec 6, 2022
- ASML Netherlands B.V.
- Jelle Nije
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optimizing an apparatus for multi-stage processing of product units
- Patent number 11,150,562
- Issue date Oct 19, 2021
- ASML Netherlands B.V.
- Jelle Nije
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Generating predicted data for control or monitoring of a production...
- Patent number 11,099,486
- Issue date Aug 24, 2021
- ASML Netherlands B.V.
- Alexander Ypma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER IMPLEMENTED METHOD FOR DIAGNOSING A SYSTEM COMPRISING A PL...
- Publication number 20240273278
- Publication date Aug 15, 2024
- ASML NETHERLANDS B.V.
- Pieter VAN HERTUM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CLASSIFYING SEMICONDUCTOR WAFERS
- Publication number 20230316103
- Publication date Oct 5, 2023
- ASML NETHERLANDS B.V.
- Vahid BASTANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURATION OF AN IMPUTER MODEL
- Publication number 20230153582
- Publication date May 18, 2023
- ASML NETHERLANDS B.V.
- Reza SAHRAEIAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING AN INSPECTION STRATEGY FOR A GROUP OF SUBSTR...
- Publication number 20230058166
- Publication date Feb 23, 2023
- ASML NETHERLANDS B.V.
- Eleftherios KOULIERAKIS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING FEATURE CONTRIBUTION TO PERFOR...
- Publication number 20220351075
- Publication date Nov 3, 2022
- ASML NETHERLANDS B.V.
- Vahid BASTANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXTRACTING A FEATURE FROM A DATA SET
- Publication number 20220128908
- Publication date Apr 28, 2022
- ASML NETHERLANDS B.V.
- Maialen LARRANAGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZING AN APPARATUS FOR MULTI-STAGE PROCESSING OF PRODUCT UNITS
- Publication number 20220004108
- Publication date Jan 6, 2022
- ASML NETHERLANDS B.V.
- Jelle NIJE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTIMIZING AN APPARATUS FOR MULTI-STAGE PROCESSING OF PRODUCT UNITS
- Publication number 20200233315
- Publication date Jul 23, 2020
- ASML NETHERLANDS B.V.
- Jelle NIJE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
GENERATING PREDICTED DATA FOR CONTROL OR MONITORING OF A PRODUCTION...
- Publication number 20190369503
- Publication date Dec 5, 2019
- ASML NETHERLANDS B.V.
- Alexander YPMA
- G05 - CONTROLLING REGULATING

Dimitra GKOROU

Person

Patents Grantslast 30 patents

Method for determining an inspection strategy for a group of substr...

Extracting a feature from a data set

Optimizing an apparatus for multi-stage processing of product units

Optimizing an apparatus for multi-stage processing of product units

Generating predicted data for control or monitoring of a production...

Patents Applicationslast 30 patents

COMPUTER IMPLEMENTED METHOD FOR DIAGNOSING A SYSTEM COMPRISING A PL...

METHOD FOR CLASSIFYING SEMICONDUCTOR WAFERS

CONFIGURATION OF AN IMPUTER MODEL

METHOD FOR DETERMINING AN INSPECTION STRATEGY FOR A GROUP OF SUBSTR...

METHOD AND APPARATUS FOR DETERMINING FEATURE CONTRIBUTION TO PERFOR...

EXTRACTING A FEATURE FROM A DATA SET

OPTIMIZING AN APPARATUS FOR MULTI-STAGE PROCESSING OF PRODUCT UNITS

OPTIMIZING AN APPARATUS FOR MULTI-STAGE PROCESSING OF PRODUCT UNITS

GENERATING PREDICTED DATA FOR CONTROL OR MONITORING OF A PRODUCTION...