Dimitri Boguslavsky

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Haifa, IL

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Patents Applicationslast 30 patents

Information Patent Application
DIRECTED MULTI-DEFLECTED ION BEAM MILLING OF A WORK PIECE AND DETER...
- Publication number 20130180843
- Publication date Jul 18, 2013
- CAMTEK LTD
- Dimitri BOGUSLAVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Preparation for Micro-Analysis
- Publication number 20080308727
- Publication date Dec 18, 2008
- SELA SEMICONDUCTOR ENGINEERING LABORATORIES LTD.
- Dimitri Boguslavsky
- G01 - MEASURING TESTING
Information Patent Application
Directed Multi-Deflected Ion Beam Milling of a Work Piece and Deter...
- Publication number 20080078750
- Publication date Apr 3, 2008
- SELA SEMICONDUCTOR ENGINEERING LABORATORIES LTD.
- Dimitri Boguslavsky
- H01 - BASIC ELECTRIC ELEMENTS