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Dimitri Soccol
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Rotselaar, BE
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Patents Grants
last 30 patents
Information
Patent Grant
CMOS compatible dew point sensor device and method of determining a...
Patent number
11,525,793
Issue date
Dec 13, 2022
Sciosense B.V.
Dimitri Soccol
G01 - MEASURING TESTING
Information
Patent Grant
CMOS-compatible dew point sensor device and method of determining a...
Patent number
11,002,696
Issue date
May 11, 2021
Sciosense B.V.
Dimitri Soccol
G01 - MEASURING TESTING
Information
Patent Grant
Sensor arrangement and method for generating measurement signals
Patent number
10,921,277
Issue date
Feb 16, 2021
ams AG
Hilco Suy
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit with CO2 sensor, composition and manufacturing m...
Patent number
9,683,099
Issue date
Jun 20, 2017
ams International AG
Rafael Sablong
G01 - MEASURING TESTING
Information
Patent Grant
Combination sensor
Patent number
9,683,968
Issue date
Jun 20, 2017
NXP B.V.
Dimitri Soccol
G01 - MEASURING TESTING
Information
Patent Grant
Integrated pH and conductivity sensor and manufacturing method thereof
Patent number
9,651,514
Issue date
May 16, 2017
NXP B.V.
Dimitri Soccol
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrochemical sensor
Patent number
9,513,247
Issue date
Dec 6, 2016
ams International AG
Matthias Merz
G01 - MEASURING TESTING
Information
Patent Grant
Thermal conductivity gas sensor with amplification material
Patent number
9,453,807
Issue date
Sep 27, 2016
ams International AG
Aurelie Humbert
G01 - MEASURING TESTING
Information
Patent Grant
Electrochemical sensor device
Patent number
9,395,318
Issue date
Jul 19, 2016
ams International AG
Matthias Merz
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit arrangement, device and gas detection method
Patent number
9,140,678
Issue date
Sep 22, 2015
NXP, B.V.
Dimitri Soccol
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having Au—Cu electrodes, and method of manufac...
Patent number
8,994,194
Issue date
Mar 31, 2015
NXP, B.V.
David van Steenwinckel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CMOS Compatible Dew Point Sensor Device and Method of Determining a...
Publication number
20210223193
Publication date
Jul 22, 2021
Sciosense B.V.
Dimitri Soccol
G01 - MEASURING TESTING
Information
Patent Application
CMOS-COMPATIBLE DEW POINT SENSOR DEVICE AND METHOD OF DETERMINING A...
Publication number
20190094164
Publication date
Mar 28, 2019
ams AG
Dimitri SOCCOL
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ARRANGEMENT AND METHOD FOR GENERATING MEASUREMENT SIGNALS
Publication number
20190041349
Publication date
Feb 7, 2019
ams AG
Hilco SUY
G01 - MEASURING TESTING
Information
Patent Application
COMBINATION SENSOR
Publication number
20150362393
Publication date
Dec 17, 2015
NXP B.V.
Dimitri Soccol
G01 - MEASURING TESTING
Information
Patent Application
Gas Sensor
Publication number
20150285750
Publication date
Oct 8, 2015
NXP B.V.
Aurelie Humbert
G01 - MEASURING TESTING
Information
Patent Application
ELECTROCHEMICAL SENSOR
Publication number
20150241375
Publication date
Aug 27, 2015
NXP B.V.
Matthias Merz
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT WITH CO2 SENSOR, COMPOSITION AND MANUFACTURING M...
Publication number
20150084100
Publication date
Mar 26, 2015
NXP B.V.
Rafael Sablong
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED PH AND CONDUCTIVITY SENSOR AND MANUFACTURING METHOD THEREOF
Publication number
20140374251
Publication date
Dec 25, 2014
Dimitri Soccol
G01 - MEASURING TESTING
Information
Patent Application
Electrochemical Sensor Device
Publication number
20140202855
Publication date
Jul 24, 2014
NXP B.V.
Matthias Merz
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT ARRANGEMENT, DEVICE AND GAS DETECTION METHOD
Publication number
20140170762
Publication date
Jun 19, 2014
NXP B.V.
Dimitri Soccol
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING AU-CU ELECTRODES, AND METHOD OF MANUFAC...
Publication number
20130207206
Publication date
Aug 15, 2013
NXP B.V.
David VAN STEENWINCKEL
G01 - MEASURING TESTING