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Patents Grantslast 30 patents

Information Patent Grant
Scan test circuit with scan clock
- Patent number 8,904,252
- Issue date Dec 2, 2014
- MediaTek Singapore Pte. Ltd.
- Dimitry Patent
- G01 - MEASURING TESTING
Information Patent Grant
Voltage source for gate oxide protection
- Patent number 7,652,524
- Issue date Jan 26, 2010
- Advanced Micro Devices, Inc.
- Dimitry Patent
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SCAN TEST CIRCUIT WITH SCAN CLOCK
- Publication number 20130031434
- Publication date Jan 31, 2013
- Dimitry Patent
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE SOURCE FOR GATE OXIDE PROTECTION
- Publication number 20090184696
- Publication date Jul 23, 2009
- Dimitry Patent
- G05 - CONTROLLING REGULATING