San Diego, CA, US
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G01 - MEASURING TESTING
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Patent Grant
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H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The Regents of the University of California
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
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G01 - MEASURING TESTING
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Patent Application
THE TEXAS A&M UNIVERSITY SYSTEM
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
The Regents of the University of California
Agrim Gupta
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Application
The Regents of the University of California
Manideep Dunna
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
The Regents of the University of California
Shih-Kai Kuo
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
The Regents of the University of California
Minghui Zhao
G01 - MEASURING TESTING
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Patent Application
The Regents of the University of California
Kshitiz Bansal
G01 - MEASURING TESTING
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Patent Application
The Regents of the University of California
Ish Kumar JAIN
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
The Regents of the University of California
Po-Han Wang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
The Regents of the University of California
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
The Regents of the University of California
Sai Roshan Ayyalasomayajula
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
The University of British Columbia
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H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Regents of the University of California
Manideep Dunna
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The Regents of the University of California
Yeswanth Reddy Guddeti
G01 - MEASURING TESTING
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Patent Application
The Regents of the University of California
Sai Roshan Ayyalasomayajula
H04 - ELECTRIC COMMUNICATION TECHNIQUE
