Dinesh Kabra

Person

Mumbai, IN

People

Patents Grantslast 30 patents

Information Patent Grant
In-line monitoring of OLED layer thickness and dopant concentration
- Patent number 12,137,601
- Issue date Nov 5, 2024
- Applied Materials, Inc.
- Yeishin Tung
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Metrology for OLED manufacturing using photoluminescence spectroscopy
- Patent number 11,927,535
- Issue date Mar 12, 2024
- Applied Materials, Inc.
- Avishek Ghosh
- G01 - MEASURING TESTING
Information Patent Grant
In-line monitoring of OLED layer thickness and dopant concentration
- Patent number 11,889,740
- Issue date Jan 30, 2024
- Applied Materials, Inc.
- Yeishin Tung
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
In-line monitoring of OLED layer thickness and dopant concentration
- Patent number 11,856,833
- Issue date Dec 26, 2023
- Applied Materials, Inc.
- Yeishin Tung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Metrology for OLED manufacturing using photoluminescence spectroscopy
- Patent number 11,662,317
- Issue date May 30, 2023
- Applied Materials, Inc.
- Avishek Ghosh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology for OLED manufacturing using photoluminescence spectroscopy
- Patent number 10,935,492
- Issue date Mar 2, 2021
- Applied Materials, Inc.
- Avishek Ghosh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION
- Publication number 20240130210
- Publication date Apr 18, 2024
- Applied Materials, Inc.
- Yeishin Tung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION
- Publication number 20230320183
- Publication date Oct 5, 2023
- Applied Materials, Inc.
- Yeishin Tung
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METROLOGY FOR OLED MANUFACTURING USING PHOTOLUMINESCENCE SPECTROSCOPY
- Publication number 20230266247
- Publication date Aug 24, 2023
- Applied Materials, Inc.
- Avishek GHOSH
- G01 - MEASURING TESTING
Information Patent Application
Method Of Forming A Halide-Containing Perovskite Film
- Publication number 20220325398
- Publication date Oct 13, 2022
- Applied Materials, Inc.
- Vijay Bhan Sharma
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METROLOGY FOR OLED MANUFACTURING USING PHOTOLUMINESCENCE SPECTROSCOPY
- Publication number 20210208077
- Publication date Jul 8, 2021
- Applied Materials, Inc.
- Avishek GHOSH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electro Optic Devices
- Publication number 20130069043
- Publication date Mar 21, 2013
- CAMBRIDGE ENTERPRISE LIMITED
- Richard H. Friend
- H01 - BASIC ELECTRIC ELEMENTS

Dinesh Kabra

Person

Patents Grantslast 30 patents

In-line monitoring of OLED layer thickness and dopant concentration

Metrology for OLED manufacturing using photoluminescence spectroscopy

In-line monitoring of OLED layer thickness and dopant concentration

In-line monitoring of OLED layer thickness and dopant concentration

Metrology for OLED manufacturing using photoluminescence spectroscopy

Metrology for OLED manufacturing using photoluminescence spectroscopy

Patents Applicationslast 30 patents

IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION

IN-LINE MONITORING OF OLED LAYER THICKNESS AND DOPANT CONCENTRATION

METROLOGY FOR OLED MANUFACTURING USING PHOTOLUMINESCENCE SPECTROSCOPY

Method Of Forming A Halide-Containing Perovskite Film

METROLOGY FOR OLED MANUFACTURING USING PHOTOLUMINESCENCE SPECTROSCOPY

Electro Optic Devices