Ding Han

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Chengdu, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting and removing defective integrate...
- Patent number 10,504,801
- Issue date Dec 10, 2019
- Texas Instruments Incorporated
- Zheng Qing Fan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER-LEVEL BACKSIDE LAYER FOR SEMICONDUCTOR APPARATUS
- Publication number 20230064066
- Publication date Mar 2, 2023
- TEXAS INSTRUMENTS INCORPORATED
- HAO ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTING AND REMOVING DEFECTIVE INTEGRATE...
- Publication number 20180114733
- Publication date Apr 26, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Zheng Qing Fan
- H01 - BASIC ELECTRIC ELEMENTS