Dipesh Ishwerbhai Patel

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Saratoga, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Serial scan chain control within an integrated circuit
- Patent number 7,734,974
- Issue date Jun 8, 2010
- ARM Limited
- Robert Campbell Aitken
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Serial scan chain control within an integrated circuit
- Publication number 20090019329
- Publication date Jan 15, 2009
- ARM Limited
- Robert Campbell Aitken
- G01 - MEASURING TESTING