Dirk Fimmel

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Radebeul, DE

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Patents Grantslast 30 patents

Information Patent Grant
High speed and high precision characterization of VTsat and VTlin o...
- Patent number 10,718,806
- Issue date Jul 21, 2020
- GLOBALFOUNDRIES Inc.
- Uwe Eckhardt
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for semiconductor voltage drop analysis
- Patent number 9,171,113
- Issue date Oct 27, 2015
- GLOBALFOUNDRIES, INC.
- Torsten Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device including a dual port static random access memory cell and m...
- Patent number 9,076,552
- Issue date Jul 7, 2015
- GLOBALFOUNDRIES Inc.
- Torsten Schaefer
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
HIGH SPEED AND HIGH PRECISION CHARACTERIZATION OF VTSAT AND VTLIN O...
- Publication number 20180113166
- Publication date Apr 26, 2018
- GLOBALFOUNDRIES INC.
- Uwe Eckhardt
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INCLUDING A DUAL PORT STATIC RANDOM ACCESS MEMORY CELL AND M...
- Publication number 20150009750
- Publication date Jan 8, 2015
- GLOBALFOUNDRIES INC.
- Torsten Schaefer
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR VOLTAGE DROP ANALYSIS
- Publication number 20140359551
- Publication date Dec 4, 2014
- GLOBALFOUNDRIES, Inc.
- Torsten Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Forming a Semiconductor Device Comprising eFuses of Incre...
- Publication number 20120164799
- Publication date Jun 28, 2012
- GLOBALFOUNDRIES INC.
- Andreas Kurz
- H01 - BASIC ELECTRIC ELEMENTS