Dirk Fuhrmann

Person

Apex, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Random access memory including circuit to compress comparison results
- Patent number 7,457,177
- Issue date Nov 25, 2008
- Infineon Technologies AG
- Rob Perry
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory with adjustable internal voltage
- Patent number 7,443,740
- Issue date Oct 28, 2008
- Infineon Technologies AG
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Test parallelism increase by tester controllable switching of chip...
- Patent number 7,362,632
- Issue date Apr 22, 2008
- Infineon Technologies AG
- Norbert Rehm
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory device
- Patent number 7,330,387
- Issue date Feb 12, 2008
- Infineon Technologies, AG
- Reidar Lindstedt
- G11 - INFORMATION STORAGE
Information Patent Grant
Random access memory including first and second voltage sources
- Patent number 7,313,033
- Issue date Dec 25, 2007
- Infineon Technologies AG
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated semiconductor memory with temperature-dependent voltage...
- Patent number 7,313,044
- Issue date Dec 25, 2007
- Infineon Technologies, AG
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for selectively accessing and configuring indi...
- Patent number 7,299,388
- Issue date Nov 20, 2007
- Infineon Technologies, AG
- Rath Ung
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing an integrated semiconductor memory with a shorte...
- Patent number 7,197,679
- Issue date Mar 27, 2007
- Infineon Technologies AG
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor arrangement
- Patent number 7,136,295
- Issue date Nov 14, 2006
- Infineon Technologies AG
- Dirk Fuhrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for testing an integrated semiconductor memory, and integrat...
- Patent number 6,963,514
- Issue date Nov 8, 2005
- Infineon Technologies AG
- Reidar Lindstedt
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Test parallelism increase by tester controllable switching of chip...
- Publication number 20070165469
- Publication date Jul 19, 2007
- Norbert Rehm
- G01 - MEASURING TESTING
Information Patent Application
Random access memory including circuit to compress comparison results
- Publication number 20070140024
- Publication date Jun 21, 2007
- Rob Perry
- G11 - INFORMATION STORAGE
Information Patent Application
Random access memory including first and second voltage sources
- Publication number 20070070683
- Publication date Mar 29, 2007
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for selectively accessing and configuring indi...
- Publication number 20070011518
- Publication date Jan 11, 2007
- Rath Ung
- G01 - MEASURING TESTING
Information Patent Application
Integrated semiconductor memory with adjustable internal voltage
- Publication number 20060181939
- Publication date Aug 17, 2006
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory device
- Publication number 20060109727
- Publication date May 25, 2006
- Reidar Lindstedt
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor arrangement
- Publication number 20050247959
- Publication date Nov 10, 2005
- Dirk Fuhrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for testing an integrated semiconductor memory with a shorte...
- Publication number 20050222796
- Publication date Oct 6, 2005
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated semiconductor memory with temperature-dependent voltage...
- Publication number 20050174164
- Publication date Aug 11, 2005
- Dirk Fuhrmann
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing an integrated semiconductor memory, and integrat...
- Publication number 20050162949
- Publication date Jul 28, 2005
- Reidar Lindstedt
- G11 - INFORMATION STORAGE

Dirk Fuhrmann

Person

Patents Grantslast 30 patents

Random access memory including circuit to compress comparison results

Integrated semiconductor memory with adjustable internal voltage

Test parallelism increase by tester controllable switching of chip...

Integrated semiconductor memory device

Random access memory including first and second voltage sources

Integrated semiconductor memory with temperature-dependent voltage...

Method and apparatus for selectively accessing and configuring indi...

Method for testing an integrated semiconductor memory with a shorte...

Semiconductor arrangement

Method for testing an integrated semiconductor memory, and integrat...

Patents Applicationslast 30 patents

Test parallelism increase by tester controllable switching of chip...

Random access memory including circuit to compress comparison results

Random access memory including first and second voltage sources

Method and apparatus for selectively accessing and configuring indi...

Integrated semiconductor memory with adjustable internal voltage

Integrated semiconductor memory device

Semiconductor arrangement

Method for testing an integrated semiconductor memory with a shorte...

Integrated semiconductor memory with temperature-dependent voltage...

Method for testing an integrated semiconductor memory, and integrat...