Dirk Kannemacher

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Neustadt am Ruebenberge, DE

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Patents Grantslast 30 patents

Information Patent Grant
On-chip probe circuit for detecting faults in an FPGA
- Patent number 9,103,880
- Issue date Aug 11, 2015
- Microsemi SoC Corporation
- Jonathan W. Greene
- G01 - MEASURING TESTING
Information Patent Grant
On-chip probe circuit for detecting faults in an FPGA
- Patent number 9,000,807
- Issue date Apr 7, 2015
- Microsemi SoC Corporation
- Jonathan W. Greene
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
On-Chip Probe Circuit for Detecting Faults in an FPGA
- Publication number 20140006887
- Publication date Jan 2, 2014
- Jonathan W. Greene
- G01 - MEASURING TESTING
Information Patent Application
On-Chip Probe Circuit for Detecting Faults in an FPGA
- Publication number 20140002136
- Publication date Jan 2, 2014
- Jonathan W. Greene
- H03 - BASIC ELECTRONIC CIRCUITRY