Dirk Meyer

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Kirchheim, GB

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Patents Grantslast 30 patents

Information Patent Grant
Method for classifying errors in the layout of a semiconductor circuit
- Patent number 7,716,613
- Issue date May 11, 2010
- Qimonda AG
- Dirk Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for performing non-local geometric operations for...
- Patent number 7,475,376
- Issue date Jan 6, 2009
- Qimonda AG
- Alexander Seidl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for correcting layout errors
- Patent number 7,310,791
- Issue date Dec 18, 2007
- Infineon Technologies AG
- Dirk Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for classifying errors in the layout of a semiconductor circuit
- Patent number 7,207,016
- Issue date Apr 17, 2007
- Infineon Technologies AG
- Dirk Meyer
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for performing local geometrical operation on a h...
- Publication number 20070011637
- Publication date Jan 11, 2007
- Alexander Seidl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for performing non-local geometric operations for...
- Publication number 20070011636
- Publication date Jan 11, 2007
- Alexander Seidl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for optimizing the geometry of structural elements of a circ...
- Publication number 20060190850
- Publication date Aug 24, 2006
- Roderick Kohle
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for correcting layout errors
- Publication number 20060053400
- Publication date Mar 9, 2006
- Dirk Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for compensation of the shortening of line ends during the f...
- Publication number 20050196686
- Publication date Sep 8, 2005
- Dirk Meyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY