Dirk Naumann

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Lorsch, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and X-ray inspection system, in particular for non-destructi...
- Patent number 10,338,269
- Issue date Jul 2, 2019
- Pia Dreiseitel
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic control of radiation emission
- Patent number 9,241,393
- Issue date Jan 19, 2016
- Analogic Corporation
- Steven Neil Urchuk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for detecting a particular material in an obje...
- Patent number 9,128,200
- Issue date Sep 8, 2015
- Smiths Heimann GmbH
- Matthias Muenster
- G01 - MEASURING TESTING
Information Patent Grant
Transport bin in an X-ray inspection system
- Patent number 8,861,676
- Issue date Oct 14, 2014
- Smiths Heimann GmbH
- Harald Bloesl
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method and device for detecting a given material in an object using...
- Patent number 7,020,241
- Issue date Mar 28, 2006
- Heimann Systems GmbH
- Knut Beneke
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 6,597,760
- Issue date Jul 22, 2003
- Heimann Systems GmbH
- Knut Beneke
- G01 - MEASURING TESTING
Information Patent Grant
Method of processing images for material recognition by X-rays
- Patent number 6,198,795
- Issue date Mar 6, 2001
- Heimann Systems GmbH
- Dirk Naumann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND X-RAY INSPECTION SYSTEM, IN PARTICULAR FOR NON-DESTRUCTI...
- Publication number 20160334535
- Publication date Nov 17, 2016
- Smiths Heimann GmbH
- Pia Dreiseitel
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC CONTROL OF RADIATION EMISSION
- Publication number 20140270081
- Publication date Sep 18, 2014
- Smiths Heimann GmbH
- Steven Neil Urchuk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TRANSPORT BIN IN AN X-RAY INSPECTION SYSTEM
- Publication number 20120189097
- Publication date Jul 26, 2012
- Harald BLOESL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING A PARTICULAR MATERIAL IN AN OBJE...
- Publication number 20110091013
- Publication date Apr 21, 2011
- Matthias MUENSTER
- G01 - MEASURING TESTING
Information Patent Application
Method and device for detecting a given material in an object using...
- Publication number 20030190011
- Publication date Oct 9, 2003
- Knut Beneke
- G01 - MEASURING TESTING
Information Patent Application
Inspection device
- Publication number 20020176533
- Publication date Nov 28, 2002
- Knut Beneke
- G01 - MEASURING TESTING