Dirk Preikszas

Person

Oberkochen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for operating a particle beam microscope
- Patent number 11,915,907
- Issue date Feb 27, 2024
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating a particle beam generator for a particle beam device
- Patent number 11,380,519
- Issue date Jul 5, 2022
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam apparatus having an aperture unit and method for sett...
- Patent number 11,139,140
- Issue date Oct 5, 2021
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical apparatus and particle beam system
- Patent number 11,087,949
- Issue date Aug 10, 2021
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method
- Patent number 10,854,421
- Issue date Dec 1, 2020
- Carl Zeiss Microscopy GmbH
- Daniela Donhauser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical apparatus and particle beam system
- Patent number 10,755,889
- Issue date Aug 25, 2020
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating a particle beam apparatus
- Patent number 10,699,869
- Issue date Jun 30, 2020
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing energy of charged particles
- Patent number 10,665,423
- Issue date May 26, 2020
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adjusting a particle beam microscope
- Patent number 10,629,404
- Issue date Apr 21, 2020
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage supply unit and circuit arrangement for generating a h...
- Patent number 10,546,717
- Issue date Jan 28, 2020
- Carl Zeiss Microscopy GmbH
- Edgar Fichter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam microscope and method for operating a particle beam m...
- Patent number 10,062,542
- Issue date Aug 28, 2018
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage supply unit and circuit arrangement for generating a h...
- Patent number 9,953,804
- Issue date Apr 24, 2018
- Carl Zeiss Microscopy GmbH
- Edgar Fichter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam apparatus and method for operating a particle beam ap...
- Patent number 9,947,504
- Issue date Apr 17, 2018
- Carl Zeiss Microscopy GmbH
- Klaus Hegele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam microscope and method for operating a particle beam m...
- Patent number 9,859,092
- Issue date Jan 2, 2018
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device comprising an electrode unit
- Patent number 9,312,093
- Issue date Apr 12, 2016
- Carl Zeiss Microscopy GmbH
- Joerg Fober
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Printed circuit board multipole for ion focusing
- Patent number 9,230,789
- Issue date Jan 5, 2016
- Carl Zeiss Microscopy GmbH
- Alexander Laue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SACP method and particle optical system for performing the method
- Patent number 9,093,246
- Issue date Jul 28, 2015
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam column and method of operating same
- Patent number 8,558,190
- Issue date Oct 15, 2013
- Carl Zeiss Microscopy GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam microscope
- Patent number 8,476,589
- Issue date Jul 2, 2013
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device for deflecting or guiding in a particle beam
- Patent number 8,421,028
- Issue date Apr 16, 2013
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle beam device with deflection system
- Patent number 8,405,045
- Issue date Mar 26, 2013
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning charged particle beams
- Patent number 8,304,750
- Issue date Nov 6, 2012
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle optical arrangement
- Patent number 8,217,350
- Issue date Jul 10, 2012
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam column and method of operating same
- Patent number 8,129,693
- Issue date Mar 6, 2012
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle optical device with magnet assembly
- Patent number 8,063,364
- Issue date Nov 22, 2011
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-beam device and detector system
- Patent number 7,910,887
- Issue date Mar 22, 2011
- Carl Zeiss NTS GmbH
- Michael D. G. Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control of instruments
- Patent number 7,523,009
- Issue date Apr 21, 2009
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-beam device and detector system
- Patent number 7,507,962
- Issue date Mar 24, 2009
- Carl Zeiss NTS GmbH
- Michael D. G. Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-beam device and detector system
- Patent number 7,425,701
- Issue date Sep 16, 2008
- Carl Zeiss NTS GmbH
- Michael D. G. Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical arrangements and particle-optical systems
- Patent number 7,022,987
- Issue date Apr 4, 2006
- Carl Zeiss NIS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE BEAM MICROSCOPE
- Publication number 20240302542
- Publication date Sep 12, 2024
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND COMPUTER PROGRAM PRO...
- Publication number 20240258065
- Publication date Aug 1, 2024
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTICLE BEAM SYSTEM HAVING A MULTI-POLE LENS SEQUENCE FOR INDEPEND...
- Publication number 20220415604
- Publication date Dec 29, 2022
- Carl Zeiss MultiSEM GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE HAVING A DEFLECTION UNIT
- Publication number 20220367142
- Publication date Nov 17, 2022
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM MICROSCOPE
- Publication number 20220246389
- Publication date Aug 4, 2022
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL APPARATUS AND PARTICLE BEAM SYSTEM
- Publication number 20200381206
- Publication date Dec 3, 2020
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPERATING A PARTICLE BEAM APPARATUS
- Publication number 20190318905
- Publication date Oct 17, 2019
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD
- Publication number 20190304743
- Publication date Oct 3, 2019
- CARL ZEISS MICROSCOPY GMBH
- Daniela Donhauser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ADJUSTING A PARTICLE BEAM MICROSCOPE
- Publication number 20190148104
- Publication date May 16, 2019
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL APPARATUS AND PARTICLE BEAM SYSTEM
- Publication number 20180286625
- Publication date Oct 4, 2018
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-VOLTAGE SUPPLY UNIT AND CIRCUIT ARRANGEMENT FOR GENERATING A H...
- Publication number 20180211815
- Publication date Jul 26, 2018
- CARL ZEISS MICROSCOPY GMBH
- Edgar Fichter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A PARTICLE BEAM AP...
- Publication number 20170236683
- Publication date Aug 17, 2017
- CARL ZEISS MICROSCOPY GMBH
- Klaus Hegele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZING ENERGY OF CHARGED PARTICLES
- Publication number 20160365221
- Publication date Dec 15, 2016
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-VOLTAGE SUPPLY UNIT AND CIRCUIT ARRANGEMENT FOR GENERATING A H...
- Publication number 20160314931
- Publication date Oct 27, 2016
- CARL ZEISS MICROSCOPY GMBH
- Edgar Fichter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM MICROSCOPE AND METHOD FOR OPERATING A PARTICLE BEAM M...
- Publication number 20160225579
- Publication date Aug 4, 2016
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM MICROSCOPE AND METHOD FOR OPERATING A PARTICLE BEAM M...
- Publication number 20160225578
- Publication date Aug 4, 2016
- CARL ZEISS MICROSCOPY GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for focusing and for storage of ions and for separation o...
- Publication number 20160020064
- Publication date Jan 21, 2016
- CARL ZEISS MICROSCOPY GMBH
- Alexander Laue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam Microscope
- Publication number 20120326032
- Publication date Dec 27, 2012
- CARL ZEISS MICROSCOPY GMBH
- Gerd Benner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Particle Beam Microscope
- Publication number 20120326030
- Publication date Dec 27, 2012
- CARL ZEISS NTS GMBH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND PARTICLE BEAM DEVICE FOR FOCUSING A PARTICLE BEAM
- Publication number 20120305797
- Publication date Dec 6, 2012
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE WITH DEFLECTION SYSTEM
- Publication number 20120138814
- Publication date Jun 7, 2012
- CARL ZEISS NTS LTD.
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM COLUMN AND METHOD OF OPERATING SAME
- Publication number 20120025095
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for focusing and for storage of ions and for separation o...
- Publication number 20110220788
- Publication date Sep 15, 2011
- Alexander Laue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle beam device and method for operation of a particle beam de...
- Publication number 20110215242
- Publication date Sep 8, 2011
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SACP Method and Particle Optical System for Performing the Method
- Publication number 20110108736
- Publication date May 12, 2011
- CARL ZEISS NTS GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle beam apparatus having an aperture unit and method for sett...
- Publication number 20110049361
- Publication date Mar 3, 2011
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM COLUMN AND METHOD OF OPERATING SAME
- Publication number 20100327179
- Publication date Dec 30, 2010
- CARL ZEISS NTS GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING CHARGED PARTICLE BEAMS
- Publication number 20100294930
- Publication date Nov 25, 2010
- CARL ZEISS NTS GMBH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR DEFLECTING OR GUIDING IN A PARTICLE BEAM
- Publication number 20100258738
- Publication date Oct 14, 2010
- Dirk Preikszas
- B82 - NANO-TECHNOLOGY
Information Patent Application
PARTICLE OPTICAL DEVICE WITH MAGNET ASSEMBLY
- Publication number 20100155597
- Publication date Jun 24, 2010
- CARL ZEISS NTS GMBH
- Dirk PREIKSZAS
- H01 - BASIC ELECTRIC ELEMENTS

Dirk Preikszas

Person

Patents Grantslast 30 patents

Method for operating a particle beam microscope

Operating a particle beam generator for a particle beam device

Particle beam apparatus having an aperture unit and method for sett...

Particle-optical apparatus and particle beam system

Charged particle beam system and method

Particle-optical apparatus and particle beam system

Operating a particle beam apparatus

Analyzing energy of charged particles

Method for adjusting a particle beam microscope

High-voltage supply unit and circuit arrangement for generating a h...

Particle beam microscope and method for operating a particle beam m...

High-voltage supply unit and circuit arrangement for generating a h...

Particle beam apparatus and method for operating a particle beam ap...

Particle beam microscope and method for operating a particle beam m...

Particle beam device comprising an electrode unit

Printed circuit board multipole for ion focusing

SACP method and particle optical system for performing the method

Charged particle beam column and method of operating same

Particle beam microscope

Device for deflecting or guiding in a particle beam

Particle beam device with deflection system

Scanning charged particle beams

Particle optical arrangement

Charged particle beam column and method of operating same

Particle optical device with magnet assembly

Electron-beam device and detector system

Control of instruments

Electron-beam device and detector system

Electron-beam device and detector system

Particle-optical arrangements and particle-optical systems

Patents Applicationslast 30 patents

PARTICLE BEAM MICROSCOPE

METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND COMPUTER PROGRAM PRO...

PARTICLE BEAM SYSTEM HAVING A MULTI-POLE LENS SEQUENCE FOR INDEPEND...

PARTICLE BEAM DEVICE HAVING A DEFLECTION UNIT

METHOD FOR OPERATING A PARTICLE BEAM MICROSCOPE

PARTICLE-OPTICAL APPARATUS AND PARTICLE BEAM SYSTEM

OPERATING A PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM SYSTEM AND METHOD

METHOD FOR ADJUSTING A PARTICLE BEAM MICROSCOPE

PARTICLE-OPTICAL APPARATUS AND PARTICLE BEAM SYSTEM

HIGH-VOLTAGE SUPPLY UNIT AND CIRCUIT ARRANGEMENT FOR GENERATING A H...

PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A PARTICLE BEAM AP...

ANALYZING ENERGY OF CHARGED PARTICLES

HIGH-VOLTAGE SUPPLY UNIT AND CIRCUIT ARRANGEMENT FOR GENERATING A H...

PARTICLE BEAM MICROSCOPE AND METHOD FOR OPERATING A PARTICLE BEAM M...

PARTICLE BEAM MICROSCOPE AND METHOD FOR OPERATING A PARTICLE BEAM M...

Apparatus for focusing and for storage of ions and for separation o...

Particle Beam Microscope

Particle Beam Microscope

METHOD AND PARTICLE BEAM DEVICE FOR FOCUSING A PARTICLE BEAM

PARTICLE BEAM DEVICE WITH DEFLECTION SYSTEM

CHARGED PARTICLE BEAM COLUMN AND METHOD OF OPERATING SAME

Apparatus for focusing and for storage of ions and for separation o...

Particle beam device and method for operation of a particle beam de...

SACP Method and Particle Optical System for Performing the Method

Particle beam apparatus having an aperture unit and method for sett...

CHARGED PARTICLE BEAM COLUMN AND METHOD OF OPERATING SAME

SCANNING CHARGED PARTICLE BEAMS

DEVICE FOR DEFLECTING OR GUIDING IN A PARTICLE BEAM

PARTICLE OPTICAL DEVICE WITH MAGNET ASSEMBLY